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| - 1 - rev. 1.0, apr. 2012 samsung electronics reserves the right to change products, information and specifications without notice. products and specifications discussed herein are for reference pur poses only. all info rmation discussed herein is provided on an "as is" bas is, without warranties of any kind. this document and all information discussed herein re main the sole and exclusive property of samsung electronics. no license of any patent, copyright, mask work, tradem ark or any other intellectual property right is granted by one party to the other party under this document, by implication, estoppel or other- wise. samsung products are not intended for use in life sup port, critical care, medical, safety equipment, or similar applications where pr oduct failure could result in loss of li fe or personal or physical harm, or any military or defense application, or any governmental procurement to which special terms or provisions may apply. for updates or additional information about samsung products, contact your nearest samsung office. all brand names, trademarks and registered tradem arks belong to their respective owners. ? 2012 samsung electronics co., ltd. all rights reserved. datasheet M393B2G70CB0 240pin registered dimm based on 4gb c-die 78fbga with lead-free & halogen-free (rohs compliant)
- 2 - datasheet ddr3 sdram rev. 1.0 registered dimm revision history revision no. history draft date remark editor 1.0 - first spec. release apr. 2012 - j.y . lee - 3 - datasheet ddr3 sdram rev. 1.0 registered dimm table of contents 240pin registered dimm based on 4gb c-die 1. ddr3 registered dimm ordering in formation ........ .............. .............. .............. ........... ........... ........... .......................... 4 2. key features................................................................................................................ ................................................. 4 3. address configuration ....................................................................................................... ........................................... 4 4. registered dimm pin configurations (front side/bac k side)................................................................... ..................... 5 5. pin description ............................................................................................................ ................................................. 6 6. on dimm thermal sensor ...................................................................................................... ..................................... 6 7. input/output functional descrip tion............. .............. .............. .............. ............ ........... ........... ..................................... 7 8. pinout comparison based on module type................. ..................................................................... ........................... 8 9. registering clock driver specification ...................................................................................... .................................... 9 9.1 timing & capacitance values ................................................................................................ .................................. 9 9.2 clock driver characteristics ............................................................................................... ...................................... 9 10. function block diagram: .................................................................................................... ......................................... 10 10.1 16gb,2gx72 module (populated as 2 ranks of x4 ddr3 sdrams) ................................................................ .... 10 11. absolute maximum ratings ....... ............................................................................................ ..................................... 12 11.1 absolute maximum dc ratings.... ........................................................................................... .............................. 12 11.2 dram component operating temperature range ......... ....................................................................... .............. 12 12. ac & dc operating conditions.... .............. .............. .............. .............. .............. ............ ......... .................................... 12 12.1 recommended dc operating conditions (sstl-15)....... .............. .............. .............. .............. .............. ............... 12 13. ac & dc input measurement levels ........................................................................................... ............................... 13 13.1 ac & dc logic input levels for single-ended signals ....................................................................... ................... 13 13.2 v ref tolerances.................................................................................................................... ................................ 14 13.3 ac and dc logic input levels for differential sign als .............. .............. .............. .............. ............. ..................... 15 13.3.1. differential signals defini tion ........................................................................................ ................................. 15 13.3.2. differential swing requirement for clock (ck - ck ) and strobe (dqs - dqs ) ............................................. 15 13.3.3. single-ended requirements for differential signal s ............. .............. .............. .............. .............. ................. 16 13.3.4. differential input cross po int voltage ................................................................................. ........................... 17 13.4 slew rate definition for single ended input signal s ....................................................................... ...................... 17 13.5 slew rate definition for differ ential input signals ...... .............. .............. .............. .............. ......... ............................ 17 14. ac & dc output measurement levels .......................................................................................... ............................. 18 14.1 single ended ac and dc output levels...................................................................................... ......................... 18 14.2 differential ac and dc output levels ................ ...................................................................... ............................. 18 14.3 single-ended output slew rate .............. .............. .............. .............. .............. ........... ............ ............................... 18 14.4 differential output slew rate ............................................................................................. ................................... 19 15. dimm idd specification definition .......................................................................................... ..................................... 20 16. idd spec table ......... ............... .............. .............. .............. ........... ........... ........... .......... ............................................ 22 17. input/output capacitance ................................................................................................... ........................................ 23 18. electrical characteristics and ac timing .......... ......................................................................... .................................. 24 18.1 refresh parameters by device density...................................................................................... ........................... 24 18.2 speed bins and cl, trcd, trp, trc and tras for corre sponding bin ....... .............. .............. ............ ........... ...... 24 18.3 speed bins and cl, trcd, trp, trc and tras for corre sponding bin ....... .............. .............. ............ ........... ...... 24 18.3.1. speed bin table notes ...... ............................................................................................ ................................ 28 19. timing parameters by speed grade ..................... ...................................................................... ............................... 29 19.1 jitter notes .............................................................................................................. .............................................. 35 19.2 timing parameter notes............ ........................................................................................ .................................... 36 20. physical dimensions..................................... ................................................................... ........................................... 37 20.1 1gbx4 based 2gx72 module (2 ranks) - M393B2G70CB0 ....................................................................... ......... 37 20.1.1. x72 dimm, populated as two physical ranks of x4 ddr3 sdrams ........... .............. .............. ........... .......... .. 37 - 4 - datasheet ddr3 sdram rev. 1.0 registered dimm 1. ddr3 registered dimm ordering information note : 1. "##" - k0/ma 2. k0(1600mbps 11-11-11) / ma(1866mbps 13-13-13)) - ddr3-1866(13-13-13) is backward compatible to ddr3-1600(11-11-11), ddr3-1333(9-9-9), ddr3-1066(7-7-7) - ddr3-1600(11-11-11) is backward compatible to ddr3-1333(9-9-9), ddr3-1066(7-7-7) 2. key features ? jedec standard 1.5v 0.075v power supply ?v ddq = 1.5v 0.075v ? 400mhz f ck for 800mb/sec/pin, 533mhz f ck for 1066mb/sec/pin, 667mhz f ck for 1333mb/sec/pin, 800mhz f ck for 1600mb/sec/pin, 933mhz f ck for 1866mb/sec/pin ? 8 independent internal bank ? programmable cas latency: 6,7,8,9,10,11,13 ? programmable additive latency(posted cas ) : 0, cl - 2, or cl - 1 clock ? programmable cas write latency(cwl) = 5 (ddr3-800), 6 (ddr3-1066), 7 (ddr3-1333), 8 (ddr3-1600) and 9 (ddr3-1866) ? burst length: 8 (interleave without any limit, sequential with starting address ?000? only), 4 with tccd = 4 which does not al low seamless read or write [either on the fly using a12 or mrs] ? bi-directional differential data strobe ? on die termination using odt pin ? average refresh period 7.8us at lower then t case 85 c, 3.9us at 85 c < t case 95 c ? asynchronous reset 3. address configuration part number 2 density organization component composition 1 number of rank height M393B2G70CB0-ck0/ma 16gb 2gx72 1gx4(k4b4g0446c-bc##)*36 2 30mm speed ddr3-800 ddr3-1066 ddr3-1333 ddr3-1600 ddr3-1866 unit 6-6-6 7-7-7 9-9-9 11-11-11 13-13-13 tck(min) 2.5 1.875 1.5 1.25 1.071 ns cas latency 6 7 911 13 nck trcd(min) 15 13.125 13.5 13.75 13.91 ns trp(min) 15 13.125 13.5 13.75 13.91 ns tras(min) 37.5 37.5 36 35 34 ns trc(min) 52.5 50.625 49.5 48.75 47.91 ns organization row address column address bank address auto precharge 1gx4(4gb) based module a0-a15 a0-a9, a11 ba0-ba2 a10/ap - 5 - datasheet ddr3 sdram rev. 1.0 registered dimm 4. registered dimm pin configurations (front side/back side) note : nc = no internal connection samsung electronics co., ltd. reserves the right to change products and specifications without notice. pin front pin back pin front pin back pin front pin back 1 v refdq 121 v ss 42 dqs 8162 nc,dqs 17 ,tdqs 17 82 dq33 202 v ss 2 v ss 122 dq4 43 dqs8 163 v ss 83 v ss 203 dm4,dqs13 ,tdqs13 3 dq0 123 dq5 44 v ss 164 cb6,nc 84 dqs 4 204 nc,dqs 13 ,tdqs 13 4dq1124 v ss 45 cb2,nc 165 cb7,nc 85 dqs4 205 v ss 5 v ss 125 dm0,dqs9 ,tdqs9 46 cb3,nc 166 v ss 86 v ss 206 dq38 6dqs 0126 nc,dqs 9 ,tdqs 9 47 v ss 167 nc(test) 87 dq34 207 dq39 7dqs0127 v ss 48 v tt , nc 168 reset 88 dq35 208 v ss 8 v ss 128 dq6 key 89 v ss 209 dq44 9 dq2 129 dq7 49 v tt , nc 169 cke1, nc 90 dq40 210 dq45 10 dq3 130 v ss 50 cke0 170 v dd 91 dq41 211 v ss 11 v ss 131 dq12 51 v dd 171 a15 92 v ss 212 dm5,dqs14 ,tdqs14 12 dq8 132 dq13 52 ba2 172 a14 93 dqs 5 213 nc,dqs 14 ,tdqs 14 13 dq9 133 v ss 53 err_out /nc 173 v dd 94 dqs5 214 v ss 14 v ss 134 dm1,dqs10 ,tdqs10 54 v dd 174 a12/bc 95 v ss 215 dq46 15 dqs 1135 nc,dqs 10 ,tdqs 10 55 a11 175 a9 96 dq42 216 dq47 16 dqs1 136 v ss 56 a7 176 v dd 97 dq43 217 v ss 17 v ss 137 dq14 57 v dd 177 a8 98 v ss 218 dq52 18 dq10 138 dq15 58 a5 178 a6 99 dq48 219 dq53 19 dq11 139 v ss 59 a4 179 v dd 100 dq49 220 v ss 20 v ss 140 dq20 60 v dd 180 a3 101 v ss 221 dm6,dqs15 ,tdqs15 21 dq16 141 dq21 61 a2 181 a1 102 dqs 6 222 nc,dqs 15 ,tdqs 15 22 dq17 142 v ss 62 v dd 182 v dd 103 dqs6 223 v ss 23 v ss 143 dm2,dqs11 ,tdqs11 63 nc, ck1 183 v dd 104 v ss 224 dq54 24 dqs 2144 nc,dqs 11 ,tdqs 11 64 nc, ck 1 184 ck0 105 dq50 225 dq55 25 dqs2 145 v ss 65 v dd 185 ck 0 106 dq51 226 v ss 26 v ss 146 dq22 66 v dd 186 v dd 107 v ss 227 dq60 27 dq18 147 dq23 67 v refca 187 event ,nc 108 dq56 228 dq61 28 dq19 148 v ss 68 nc/par_in 188 a0 109 dq57 229 v ss 29 v ss 149 dq28 69 v dd 189 v dd 110 v ss 230 dm7/dqs16 tdqs16 30 dq24 150 dq29 70 a10/ap 190 ba1 111 dqs 7 231 dm7,dqs 16 ,tdqs 16 31 dq25 151 v ss 71 ba0 191 v dd 112 dqs7 232 v ss 32 v ss 152 dm3,dqs12 ,tdqs12 72 v dd 192 ras 113 v ss 233 dq62 33 dqs 3153 nc,dqs 12 ,tdqs 12 73 we 193 s 0 114 dq58 234 dq63 34 dqs3 154 v ss 74 cas 194 v dd 115 dq59 235 v ss 35 v ss 155 dq30 75 v dd 195 odt0 116 v ss 236 v ddspd 36 dq26 156 dq31 76 s 1,nc 196 a13 117 sa0 237 sa1 37 dq27 157 v ss 77 odt1,nc 197 v dd 118 scl 238 sda 38 v ss 158 cb4,nc 78 v dd 198 s 3,nc 119 sa2 239 v ss 39 cb0,nc 159 cb5,nc 79 s 2,nc 199 v ss 120 v tt 240 v tt 40 cb1,nc 160 v ss 80 v ss 200 dq36 41 v ss 161 dm8,dqs17 tdqs17,nc 81 dq32 201 dq37 - 6 - datasheet ddr3 sdram rev. 1.0 registered dimm 5. pin description note : *the v dd and v ddq pins are tied common to a single power-plane on these designs. 6. on dimm thermal sensor note : 1. all samsung rdimm support thermal sensor on dimm 2. when the spd and the thermal sensor are placed on the module, r1 is placed but r2 is not. when only the spd is plac ed on the module, r2 is placed but r1 is not. [ table 1 ] temperature sensor characteristics pin name description number pin name description number ck0 clock input, positive line 1 odt[1:0] on die termination inputs 2 ck0 clock input, negative line 1 dq[63:0] data input/output 64 cke[1:0] clock enables 2 cb[7:0] data check bits input/output 8 ras row address strobe 1 dqs[8:0] data strobes 9 cas column address strobe 1 dqs [8:0] data strobes, negative line 9 we write enable 1 dm[8:0]/ dqs[17:9] tdqs[17:9] data masks/ data strobes, termination data strobes 9 s [3:0] chip selects 4 dqs [17:9] tdqs [17:9] data strobes, negative line, termination data strobes 9 a[9:0],a11, a[15:13] address inputs 2\14 rfu reserved for future use 2 a10/ap address input/autoprecharge 1 event reserved for optional hardware temperature sensing 1 a12/bc address input/burst chop 1 test memory bus test toll (not connected and not usable on dimms) 1 ba[2:0] sdram bank addresses 3 reset register and sdram control pin 1 scl serial presence detect (spd) clock input 1 v dd power supply 22 sda spd data input/output 1 v ss ground 59 sa[2:0] spd address inputs 3 v refdq reference voltage for dq 1 par_in parity bit for the address and control bus 1 v refca reference voltage for ca 1 err_out parity error found on the address and control bus 1 v tt termination voltage 4 v ddspd spd power 1 total 240 grade range temperature sensor accuracy units note min. typ. max. b 75 < ta < 95 - +/- 0.5 +/- 1.0 c - 40 < ta < 125 - +/- 1.0 +/- 2.0 - -20 < ta < 125 - +/- 2.0 +/- 3.0 - resolution 0.25 c /lsb - scl sda wp/event sa0 sa1 sa2 sa0 sa1 sa2 event r1 0 r2 0 - 7 - datasheet ddr3 sdram rev. 1.0 registered dimm 7. input/output functional description symbol type polarity function ck0 input positive edge positive line of the differential pair of system cloc k inputs that drives input to the on-dimm clock driver. ck0 input negative edge negative line of the differential pair of system clock i nputs that drives the input to the on-dimm clock driver. cke[1:0] input active high cke high activates, and cke low deactivates in ternal clock signals, and device input buffers and output drivers of the sdrams. taking cke low provides precharge power-down and self refresh operation (all banks idle), or active power down (row active in any bank) s [3:0] input active low enables the associated sdram command dec oder when low and disables decoder when high. when decoder is disabled, new commands are ignored and previous operations continue. these input signals also disable all outputs (except cke and odt) of the register(s) on the dimm when both inputs are high. when both s[1:0] are high, all register outputs (except cke, odt and chip select) remain in the previous state. for modules supporting 4 ranks, s[3: 2] operate similarly to s[1:0] for a second set of reg- ister outputs. odt[1:0] input active high on-die termination control signals r as , cas , we input active low when sampled at the positive rising edge of the clock, cas , ras , and we define the operation to be exe- cuted by the sdram. v refdq supply reference voltage for dq0-dq63 and cb0-cb7 v refca supply reference voltage for a0-a15, ba0-ba2, ras , cas , we , s0 , s1 , cke0, cke1, par_in, odt0 and odt1. ba[2:0] input selects which sdram bank of eight is activated. ba0 - ba2 define to which bank an active, read, wr ite or precharge command is being applied. bank address also determines mode register is to be accessed during an mrs cycle. a[15:13, 12/bc,11, 10/ap,9:0] input provided the row address for active commands and the column address and auto precharge bit for read/ write commands to select one location out of the memo ry array in the respective bank. a10 is sampled dur- ing a precharge command to determine whether the pr echarge applies to one bank (a10 low) or all banks (a10 high). if only one bank is to be precharged, the bank is selected by ba. a12 is also utilized for bl 4/8 identification for "bl on the fly" during cas comm and. the address inputs also provide the op-code during mode register set commands. dq[63:0], cb[7:0] i/o data and check bit input/output pins dm[8:0] active high masks write data when high, issued concurrently with input data. v dd , v ss supply power and ground for the ddr sdram input buffers and core logic. v tt supply termination voltage for address/command/control/clock nets. dqs[17:0] i/o positive edge positive line of the differential data strobe for input and output data. dqs [17:0] i/o negative edge negative line of the differential data strobe for input and output data. tdqs[17:9], tdqs [17:9] out tdqs/tdqs is applicable for x8 drams only. when enabled vi a mode register a11=1 in mr1, dram will enable the same termination resistance function on tdqs/tdqs that is applied to dqs/dqs . when dis- abled via mode register a11=0 in mr1, dm/tdqs will pr ovide the data mask function and tdqs is not used. x4/x16 drams must disable the tdqs function via mode register a11=0 in mr1 sa[2:0] in these signals are tied at the system planar to either v ss or v ddspd to configure the serial spd eeprom address range. sda i/o this bidirectional pin is used to transfer data in to or out of the spd eeprom. a resistor must be connected from the sda bus line to v ddspd on the system planar to act as a pull-up. scl in this signal is used to clock data into and out of the spd eeprom. a resistor may be connected from the scl bus time to v ddspd on the system planar to act as a pull-up. event out (open drain) active low this signal indicates that a thermal event has be en detected in the thermal sensing device.the system should guarantee the electrical level requirement is met for the event pin on ts/spd part. v ddspd supply serial eeprom positive power supply wired to a separa te power pin at the connector which supports from 3.0 volt to 3.6 volt (nominal 3.3v) operation. reset in the reset pin is connected to the reset pin on the register and to the reset pin on the dram. when low, all register outputs will be driven low and the cloc k driver clocks to the drams and register(s) will be set to low level (the clock driver will remain synchronized with the input clock) par_in in parity bit for the address and control bus. ("1 " : odd, "0 ": even) err_out out (open drain) parity error detected on the address and control bus. a resistor may be connected from err_out bus line to v dd on the system planar to act as a pull up. test used by memory bus analysis tools (unused ( nc) on memory dimms) - 8 - datasheet ddr3 sdram rev. 1.0 registered dimm 8. pinout comparison based on module type note : nc = no internal connection pin rdimm udimm signal note signal note 48, 49 v tt additional connection for termination voltage for address/command/control/clock nets. nc not used on udimms 120, 240 v tt termination voltage for address/command/con- trol/clock nets. v tt termination voltage for address/command/con- trol/clock nets. 53 err_out connected to the register on all rdimms nc not used on udimms nc nc not used on udimms 63 nc not used on rdimms ck1 used for 2 rank udimms, not used on single-rank udimms, but terminated 64 nc ck1 68 par_in connected to the register on all rdimms nc not used on rdimms 76 s 1 connected to the register on all rdimms s 1 used for dual-rank udimms, not connected on single-rank udimms 77 odt1, nc connected to the register on dual- and quadrank rdimms; nc on single-rank rdimms odt1,nc used for dual-rank udimms, not connected on single-rank udimms 79 s 2, nc connected to the register on quad-rank rdimms, not connected on single or dual rank rdimms nc not used on udimms 167 nc test input used only on bus analysis probes nc test input used only on bus analysis probes 169 cke1 connected to the register on dual- and quadrank rdimms; nc on single-rank rdimms cke1, nc used for dual-rank udimms, not connected on single-rank udimms 171 a15 connected to the register on all rdimms a15, nc depending on device density, may not be connected to sdrams on udimms. however, these signals are terminated on udimms. a15 not routed on some rcs 172 a14 a14 196 a13 a13 198 s 3, nc connected to the register on quad-rank rdimms, not connected on single-or dual-rank rdimms nc not used on udimms 39, 40, 45, 46, 158, 159, 164, 165 cbn used on all rdimms; (n = 0...7) nc, cbn used on x72 udimms, (n = 0...7); not used on x64 udimms 125, 134, 143, 152, 161, 203, 212, 221, 230 dqsn, tdqsn connected to dqs on x4 sdrams, tdqs on x8 sdrams on rdimms; (n = 9...17) dmn connected to dm on x8 drams, udm or ldm on x16 drams on udimms; (n = 0...8) 126, 135, 144, 153, 162, 204, 213, 222, 231 dqs n, tdqs n connected to dqs on x4 drams, tdqs on x8 sdrams on rdimms; (n=9...17) nc not used on udimms 187 event nc connected to optional thermal sensing compo- nent. nc on modules without a thermal sensing component. nc not used on udimms - 9 - datasheet ddr3 sdram rev. 1.0 registered dimm 9. registering clock driver specification 9.1 timing & capacitance values 9.2 clock driver characteristics symbol parameter conditions t c = tbd v dd = 1.5 0.075v units notes min max fclock input clock frequency application frequency 300 670 mhz t ch /t cl pulse duration, ck, ck high or low 0.4 - t ck t act inputs active time4 before reset is taken high dcke0/1 = low and dcs0/1 = high 8- t ck t su setup time input valid before ck/ck 100 - ps t h hold time input to remain valid after ck/ ck 175 - t pdm propagation delay, single-bit switching ck/ck to output 0.65 1.0 ns t dis output disable time(1/2-clock pre-launch) ck/ck to output float 0.5 - t ck output disable time(3/4-clock pre-launch) 0.25 - t en output enable time(1/2-clock pre-launch) ck/ck to output driving -0.5 t ck output enable time(3/4-clock pre-launch) - 0.25 c in (data) data input capacitance 1.5 2.5 pf c in (clock) data input capacitance 2 3 c in (rst) reset input capacitance - 3 symbol parameter conditions t c = tbd v dd = 1.5 0.075v units notes min max t jit (cc) cycle-to-cycle period jitter 0 40 ps t stab stabilization time -6us t fdyn dynamic phase offset -50 50 ps t cksk clock output skew 50 ps t jit (per) yn clock period jitter -40 40 ps t jit (hper) half period jitter -50 50 ps t qsk1 qn output to clock tolerance (standard 1/2 -clock pre-launch) output inversion enabled -100 200 ps output inversion disabled -100 300 t qsk1 output clock tolerance (3/4 clock pre-launch) output inversion enabled -100 200 ps output inversion disabled -100 300 t dynoff maximum re-driven dynamic clock off-set -80 80 ps - 10 - datasheet ddr3 sdram rev. 1.0 registered dimm 10. function block diagram: 10.1 16gb,2gx72 module (populated as 2 ranks of x4 ddr3 sdrams) dqs17 dqs 17 vss cb[7:4] dqs dqs dm dq[3:0] d17 cs ras cas we ck ck cke odt a[n:0]/ba[n:0] rs 0a rras a rcas a rwe a pck0a pck0 a rcke0a rodt0a a[n:0]a /ba[n:0]a d17b cs ras cas we ck ck cke odt a[n:0]/ba[n:0] rs 1a pck1a pck1 a rcke1a rodt1a dqs dqs dm dq[3:0] dqs12 dqs 12 vss dq[31:28] dqs dqs dm dq[3:0] d12 cs ras cas we ck ck cke odt a[n:0]/ba[n:0] d12b cs ras cas we ck ck cke odt a[n:0]/ba[n:0] dqs dqs dm dq[3:0] dqs11 dqs 11 vss dq[23:20] dqs dqs dm dq[3:0] d11 cs ras cas we ck ck cke odt a[n:0]/ba[n:0] d11b cs ras cas we ck ck cke odt a[n:0]/ba[n:0] dqs dqs dm dq[3:0] dqs10 dqs 10 vss dq[15:12] dqs dqs dm dq[3:0] d10 cs ras cas we ck ck cke odt a[n:0]/ba[n:0] d10b cs ras cas we ck ck cke odt a[n:0]/ba[n:0] dqs dqs dm dq[3:0] dqs0 dqs 0 vss dq[3:0] dqs dqs dm dq[3:0] d0 cs ras cas we ck ck cke odt a[n:0]/ba[n:0] d0b cs ras cas we ck ck cke odt a[n:0]/ba[n:0] dqs dqs dm dq[3:0] vtt dqs8 dqs 8 vss cb[3:0] dqs dqs dm dq[3:0] d8 cs ras cas we ck ck cke odt a[n:0]/ba[n:0] rs 0a rras a rcas a rwe a pck0a pck0 a rcke0a rodt0a a[n:0]a /ba[n:0]a d8b cs ras cas we ck ck cke odt a[n:0]/ba[n:0] rs 1a pck1a pck1 a rcke1a rodt1a dqs dqs dm dq[3:0] dqs3 dqs 3 vss dq[27:24] dqs dqs dm dq[3:0] d3 cs ras cas we ck ck cke odt a[n:0]/ba[n:0] d3b cs ras cas we ck ck cke odt a[n:0]/ba[n:0] dqs dqs dm dq[3:0] dqs2 dqs 2 vss dq[19:16] dqs dqs dm dq[3:0] d2 cs ras cas we ck ck cke odt a[n:0]/ba[n:0] d2b cs ras cas we ck ck cke odt a[n:0]/ba[n:0] dqs dqs dm dq[3:0] dqs1 dqs 1 vss dq[11:8] dqs dqs dm dq[3:0] d1 cs ras cas we ck ck cke odt a[n:0]/ba[n:0] d1b cs ras cas we ck ck cke odt a[n:0]/ba[n:0] dqs dqs dm dq[3:0] dqs9 dqs 9 vss dq[7:4] dqs dqs dm dq[3:0] d9 cs ras cas we ck ck cke odt a[n:0]/ba[n:0] d9b cs ras cas we ck ck cke odt a[n:0]/ba[n:0] dqs dqs dm dq[3:0] vtt - 11 - datasheet ddr3 sdram rev. 1.0 registered dimm v ss v dd d0 - d35 v refca v ddspd serial pd v tt v refdq d0 - d35 d0 - d35 d0 - d35 dqs4 dqs 4 vss cb[35:32] dqs dqs dm dq[3:0] d4 cs ras cas we ck ck cke odt a[n:0]/ba[n:0] rs 0b rras b rcas b rwe b pck0b pck0 b rcke0b rodt0b a[n:0]b /ba[n:0]b d4b cs ras cas we ck ck cke odt a[n:0]/ba[n:0] rs 1b pck1b pck1 b rcke1b rodt1b dqs dqs dm dq[3:0] dqs5 dqs 5 vss dq[43:40] dqs dqs dm dq[3:0] d5 cs ras cas we ck ck cke odt a[n:0]/ba[n:0] d5b cs ras cas we ck ck cke odt a[n:0]/ba[n:0] dqs dqs dm dq[3:0] dqs6 dqs 6 vss dq[51:48] dqs dqs dm dq[3:0] d6 cs ras cas we ck ck cke odt a[n:0]/ba[n:0] d6b cs ras cas we ck ck cke odt a[n:0]/ba[n:0] dqs dqs dm dq[3:0] dqs7 dqs 7 vss dq[59:56] dqs dqs dm dq[3:0] d7 cs ras cas we ck ck cke odt a[n:0]/ba[n:0] d7b cs ras cas we ck ck cke odt a[n:0]/ba[n:0] dqs dqs dm dq[3:0] vtt dqs13 dqs 13 vss cb[39:36] dqs dqs dm dq[3:0] d13 cs ras cas we ck ck cke odt a[n:0]/ba[n:0] rs 0b rras b rcas b rwe b pck0b pck0 b rcke0b rodt0b a[n:0]b /ba[n:0]b d13b cs ras cas we ck ck cke odt a[n:0]/ba[n:0] rs 1b pck1b pck1 b rcke1b rodt1b dqs dqs dm dq[3:0] dqs14 dqs 14 vss dq[47:44] dqs dqs dm dq[3:0] d14 cs ras cas we ck ck cke odt a[n:0]/ba[n:0] d14b cs ras cas we ck ck cke odt a[n:0]/ba[n:0] dqs dqs dm dq[3:0] dqs15 dqs 15 vss dq[55:52] dqs dqs dm dq[3:0] d15 cs ras cas we ck ck cke odt a[n:0]/ba[n:0] d15b cs ras cas we ck ck cke odt a[n:0]/ba[n:0] dqs dqs dm dq[3:0] dqs16 dqs1 6 vss dq[63:60] dqs dqs dm dq[3:0] d16 cs ras cas we ck ck cke odt a[n:0]/ba[n:0] d16b cs ras cas we ck ck cke odt a[n:0]/ba[n:0] dqs dqs dm dq[3:0] vtt a0 integrated thermal sensor in spd a1 a2 sa0 sa1 sa2 scl sda event event serial pd w/ integrated thermal sensor note : 1. see wiring diagrams for resistor values. 2. zq pins of each sdram are connected to individual rzq resistors (240 +/-1%)ohms... 1:2 r e g i s t e r ba[n:0] a[n:0] ras cas we cke0 reset rst : sdrams d[17:0], d[17:0]b par_in s0 rs 0a -> cs 0 : sdrams d[3:0], d[12:8], d17 err_out rst ck 0 odt0 ck0 rs 0b -> cs 0 : sdrams d[7:4]b, d[16:13] b rs 1a -> cs 1 : sdrams d[3:0]b, d[12:8]b, d17b rs 1b -> cs 1 : sdrams d[7:4], d[16:13] rba[n:0]a -> ba[n:0]: sdrams d[3:0], d[12:8], d17,d[3:0]b, d[12:8]b, d17b rba[n:0]b -> ba[n:0]: sdrams d[7:4], d[16:13], d[7:4]b, d[16:13]b ra[n:0]a -> a[n:0]: sdrams d[3:0], d[12:8], d17, d[3:0]b, d[12:8]b, d17b ra[n:0]b -> a[n:0]: sdrams d[7:4], d[16:13], d[7:4], d[16:13]b rras a -> ras : sdrams d[3:0], d[12:8],d17, d[3:0]b, d[12:8]b, d17b rras b -> ras : sdrams d[7:4], d[16:13], d[7:4]b, d[16:13]b rcas a -> cas : sdrams d[3:0], d[12:8], d17, d[3:0]b, d[12:8]b, d17b rcas b -> cas : sdrams d[7:4], d[16:13], d[7:4]b, d[16:13]b rwe a -> we : sdrams d[3:0], d[12:8], d17, d[3:0]b, d[12:8]b, d17b rwe b -> we : sdrams d[7:4], d[16:13], d[7:4]b, d[16:13]b rcke0a -> cke0: sdrams d[3:0], d[12:8], d17 rcke0b -> cke0: sdrams d[7:4]b, d[16:13]b rodt0a -> odt0: sdrams d[3:0], d[12:8], d17 rodt0b -> odt0: sdrams d[7:4]b, d[16:13]b pck0a -> ck: sdrams d[3:0], d[12:8], d17 pck0b -> ck: sdrams d[7:4]b, d[16:13]b pck1a -> ck: sdrams d[3:0]b, d[12:8]b, d17b pck1b -> ck: sdrams d[7:4], d[16:13] s1 cke1 rcke1a -> cke1: sdrams d[3:0], d[12:8]b, d17b rcke1b -> cke1: sdrams d[7:4], d[16:13] odt1 rodt1a -> odt1: sdrams d[3:0]b, d[12:8]b, d17b rodt1b -> odt1: sdrams d[7:4], d[16:13] pck0 a -> ck : sdrams d[3:0], d[12:8], d17 pck0 b -> ck : sdrams d[7:4]b, d[16:13]b pck1 a -> ck : sdrams d[3:0]b, d[12:8]b, d17b pck1 b -> ck : sdrams d[7:4], d[16:13] ck 1 ck1 120 - 12 - datasheet ddr3 sdram rev. 1.0 registered dimm 11. absolute maximum ratings 11.1 absolute maximum dc ratings note : 1. stresses greater than those listed under ?absolute maximum rating s? may cause permanent damage to the device. this is a stre ss rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. storage temperature is the case surface temperature on the ce nter/top side of the dram. for the measurement conditions, plea se refer to jesd51-2 standard. 3. v dd and v ddq must be within 300mv of each other at all times; and v ref must be not greater than 0.6 x v ddq , when v dd and v ddq are less than 500mv; v ref may be equal to or less than 300mv. 11.2 dram component operating temperature range note : 1. operating temperature t oper is the case surface temperature on the center/top side of t he dram. for measurement conditions, please refer to the jedec docu ment jesd51-2. 2. the normal temperature range specifies the temperatures where all dram specifications will be supported. during operation, t he dram case temperature must be main - tained between 0-85 c under all operating conditions 3. some applications require operation of the extended temperature range between 85 c and 95 c case temperature. full specifications are guaranteed in this range, but the following additional conditions apply: a) refresh commands must be doubled in frequency, ther efore reducing the refresh interval trefi to 3.9us. b) if self-refresh operation is required in the extended temperat ure range, then it is mandatory to either use the manual self- refresh mode with extended temperature range capability (mr2 a6 = 0b and mr2 a7 = 1b), in this case idd6 current can be increased around 10~20% than normal temperatur e range. 12. ac & dc operating conditions 12.1 recommended dc operat ing conditions (sstl-15) note : 1. under all conditions v ddq must be less than or equal to v dd . 2. v ddq tracks with v dd . ac parameters are measured with v dd and v ddq tied together. symbol parameter rating units note v dd voltage on v dd pin relative to v ss -0.4 v ~ 1.80 v v 1,3 v ddq voltage on v ddq pin relative to v ss -0.4 v ~ 1.80 v v 1,3 v in, v out voltage on any pin relative to v ss -0.4 v ~ 1.80 v v 1 t stg storage temperature -55 to +100 c 1, 2 symbol parameter rating unit note t oper operating temperature range 0 to 95 c 1, 2, 3 symbol parameter rating units note min. typ. max. v dd supply voltage 1.425 1.5 1.575 v 1,2 v ddq supply voltage for output 1.425 1.5 1.575 v 1,2 - 13 - datasheet ddr3 sdram rev. 1.0 registered dimm 13. ac & dc input measurement levels 13.1 ac & dc logic input leve ls for single-ended signals [ table 2 ] single-ended ac & dc input levels for command and address note : 1. for input only pins except reset , v ref = v refca (dc) 2. see ?overshoot/undershoot specification? on page 18. 3. the ac peak noise on v ref may not allow v ref to deviate from v ref (dc) by more than 1% v dd (for reference : approx. 15mv) 4. for reference : approx. v dd /2 15mv 5. v ih (dc) is used as a simplified symbol for v ih.ca (dc100) 6. v il (dc) is used as a simplified symbol for v il.ca (dc100) 7. v ih (ac) is used as a simplified symbol for v ih.ca (ac175), v ih.ca (ac150), v ih.ca (ac135) and v ih.ca (ac125); v ih.ca (ac175) value is used when v ref + 175mv is referenced , v ih.ca (ac150) value is used when vr ef + 150mv is referenced, v ih.ca (ac135) value is used when vref + 135mv is referenced and v ih.ca (ac125) value is used when vref + 125mv is referenced. 8. v il (ac) is used as a simplified symbol for v il.ca (ac175) and v il.ca (ac150), v il.ca (ac135) and v il.ca (ac125); v il.ca (ac175) value is used when v ref - 175mv is refer- enced, v il.ca (ac150) value is used when v ref - 150mv is referenced, v il.ca (ac135) value is used when v ref - 135mv is referenced and v il.ca (ac125) value is used when v ref - 125mv is referenced. [ table 3 ] single-ended ac & dc input levels for dq and dm note : 1. for input only pins except reset , v ref = v refdq (dc) 2. see ?overshoot/undershoot specification? on page 18. 3. the ac peak noise on v ref may not allow v ref to deviate from v ref (dc) by more than 1% v dd (for reference : approx. 15mv) 4. for reference : approx. v dd /2 15mv 5. v ih (dc) is used as a simplified symbol for v ih.dq (dc100) 6. v il (dc) is used as a simplified symbol for v il.dq (dc100) 7. v ih (ac) is used as a simplified symbol for v ih.dq (ac175), v ih.dq (ac150) and v ih.dq (ac135) ; v ih.dq (ac175) value is used when v ref + 175mv is referenced, v ih.dq (ac150) value is used when v ref + 150mv is referenced. 8. v il (ac) is used as a simplified symbol for v il.dq (ac175), v il.dq (ac150) ; v il.dq (ac175) value is used when v ref - 175mv is referenced, v il.dq (ac150) value is used when v ref - 150mv is referenced. symbol parameter ddr3-800/1066/1333/1600 ddr3-1866 unit note min. max. min. max. v ih.ca (dc100) dc input logic high v ref + 100 v dd v ref + 100 v dd mv 1,5 v il.ca (dc100) dc input logic low v ss v ref - 100 v ss v ref - 100 mv 1,6 v ih.ca (ac175) ac input logic high v ref + 175 note 2 - - mv 1,2,7 v il.ca (ac175) ac input logic low note 2 v ref - 175 --mv1,2,8 v ih.ca (ac150) ac input logic high v ref +150 note 2 - - mv 1,2,7 v il.ca (ac150) ac input logic low note 2 v ref -150 --mv1,2,8 v ih.ca (ac135) ac input logic high - - v ref + 135 note 2 mv 1,2,7 v il.ca (ac135) ac input logic low - - note 2 v ref - 135 mv 1,2,8 v ih.ca (ac125) ac input logic high - - v ref +125 note 2 mv 1,2,7 v il.ca (ac125) ac input logic low - - note 2 v ref -125 mv 1,2,8 v refca (dc) reference voltage for add, cmd inputs 0.49*v dd 0.51*v dd 0.49*v dd 0.51*v dd v3,4 symbol parameter ddr3-800/1066 ddr3-1333/1600 ddr3-1866 unit note min. max. min. max. min. max. v ih.dq (dc100) dc input logic high v ref + 100 v dd v ref + 100 v dd v ref + 100 v dd mv 1,5 v il.dq (dc100) dc input logic low v ss v ref - 100 v ss v ref - 100 v ss v ref - 100 mv 1,6 v ih.dq (ac175) ac input logic high v ref + 175 note 2----mv1,2,7 v il.dq (ac175) ac input logic low note 2 v ref - 175 ----mv1,2,8 v ih.dq (ac150) ac input logic high v ref + 150 note 2 v ref + 150 note 2 - - mv 1,2,7 v il.dq (ac150) ac input logic low note 2 v ref - 150 note 2 v ref - 150 - - mv 1,2,8 v ih.dq (ac135) ac input logic high - - - - v ref + 135 note 2 mv 1,2,7 v il.dq (ac135) ac input logic low - - - - note 2 v ref - 135 mv 1,2,8 v ref dq (dc) reference voltage for dq, dm inputs 0.49*v dd 0.51*v dd 0.49*v dd 0.51*v dd 0.49*v dd 0.51*v dd v3,4 - 14 - datasheet ddr3 sdram rev. 1.0 registered dimm 13.2 v ref tolerances. the dc-tolerance limits and ac-noise limits for the reference voltages v refca and v refdq are illustrate in figure 1. it shows a valid reference voltage v ref (t) as a function of time. (v ref stands for v refca and v refdq likewise). v ref (dc) is the linear average of v ref (t) over a very long period of time (e.g. 1 sec). this average has to meet the min/max requirements of v ref . fur- thermore v ref (t) may temporarily deviate from v ref (dc) by no more than 1% v dd . figure 1. illustration of vref(dc) tolerance and vref ac-noise limits the voltage levels for setup and hold time measurements v ih (ac), v ih (dc), v il (ac) and v il (dc) are dependent on v ref . "v ref " shall be understood as v ref (dc), as defined in figure 1. this clarifies, that dc-variations of v ref affect the absolute voltage a signal has to reach to achi eve a valid high or low level and therefore the time to which setup and hold is measured. system ti ming and voltage budgets need to account for v ref (dc) deviations from the optimum position within the data-eye of the input signals. this also clarifies that the dram setup/hold specification and derating values need to include time and voltage associated wit h v ref ac-noise. timing and voltage effects due to ac-noise on v ref up to the specified limit (+/-1% of v dd ) are included in dram timings and their associated deratings. voltage v dd v ss time - 15 - datasheet ddr3 sdram rev. 1.0 registered dimm 13.3 ac and dc logic input levels for differential signals 13.3.1 differential signals definition figure 2. definition of differential ac-swing and "time above ac level" tdvac 13.3.2 differential swing requirement for clock (ck - ck ) and strobe (dqs - dqs ) note : 1. used to define a differential signal slew-rate. 2. for ck - ck use v ih /v il (ac) of add/cmd and v refca ; for dqs - dqs use v ih /v il (ac) of dqs and v refdq ; if a reduced ac-high or ac-low le vel is used for a signal group, then the reduced level applies also here. 3. these values are not defined, however they single-ended signals ck, ck , dqs, dqs , dqsl need to be within the respective limits (v ih (dc) max, v il (dc)min) for single- ended signals as well as the limitations for overshoot and u ndershoot. refer to "overshoot and undersheet specification" [ table 4 ] allowed time before ringback (tdvac) for ck - ck and dqs - dqs . symbol parameter ddr3-800/1066/1333/1600/1866 unit note min max v ihdiff differential input high +0.2 note 3 v 1 v ildiff differential input low note 3 -0.2 v 1 v ihdiff (ac) differential input high ac 2 x (v ih (ac) - v ref ) note 3 v 2 v ildiff (ac) differential input low ac note 3 2 x (v il (ac) - v ref ) v2 slew rate [v/ns] tdvac [ps] @ |v ih/ldiff (ac)| = 350mv tdvac [ps] @ |v ih/ldiff (ac)| = 300mv tdvac [ps] @ |v ih/ldiff (ac)| = 270mv tdvac [ps] @ |v ih/ldiff (ac)| = 250mv min max min max min max min max > 4.0 75 - 175 - tbd - tbd - 4.0 57 - 170 - tbd - tbd - 3.0 50 - 167 - tbd - tbd - 2.0 38 - 163 - tbd - tbd - 1.8 34 - 162 - tbd - tbd - 1.6 29 - 161 - tbd - tbd - 1.4 22 - 159 - tbd - tbd - 1.2 13 - 155 - tbd - tbd - 1.0 0 - 150 - tbd - tbd - < 1.0 0 - 150 - tbd - tbd - 0.0 tdvac v ih .diff.min half cycle differential input voltage (i.e. dqs-dqs , ck-ck ) time tdvac v ih .diff.ac.min v il .diff.max v il .diff.ac.max - 16 - datasheet ddr3 sdram rev. 1.0 registered dimm 13.3.3 single-ended requirements for differential signals each individual component of a differential signal (ck, dqs, ck , dqs ) has also to comply with cert ain requirements for single-ended signals. ck and ck have to approximately reach v seh min / v sel max (approximately equal to the ac-levels ( v ih (ac) / v il (ac) ) for add/cmd signals) in every half-cycle. dqs, dqs have to reach v seh min / v sel max (approximately the ac-levels ( v ih (ac) / v il (ac) ) for dq signals) in every half-cycle proceeding and follow- ing a valid transition. note that the applicable ac-levels for add/cmd and dq ?s might be different per speed-bin etc. e.g. if v ih 150(ac)/v il 150(ac) is used for add/cmd signals, then these ac-levels apply also for the single-ended signals ck and ck . figure 3. single-ended requirement for differential signals note that while add/cmd and dq signal requirements are with respect to v ref , the single-ended components of differential signals have a requirement with respect to v dd /2; this is nominally the same. the trans ition of single-ended signals through the ac-lev els is used to measure setup time. for single- ended components of differential signals the requirement to reach v sel max, v seh min has no bearing on timing, but adds a restriction on the common mode characteristics of these signals. [ table 5 ] single ended levels for ck, dqs, ck , dqs note : 1. for ck, ck use v ih /v il (ac) of add/cmd; for strobes (dqs, dqs ) use v ih /v il (ac) of dqs. 2. v ih (ac)/v il (ac) for dqs is based on v refdq ; v ih (ac)/v il (ac) for add/cmd is based on v refca ; if a reduced ac-high or ac-low level is used for a signal group, then the reduced level applies also here 3. these values are not defined, however the single-ended signals ck, ck , dqs, dqs need to be within the respective limits (v ih (dc) max, v il (dc)min) for single-ended sig- nals as well as the limitations for overshoot and unders hoot. refer to "overshoot and undershoot specification" symbol parameter ddr3-800/1066/1333/1600/1866 unit note min max v seh single-ended high-level for strobes (v dd /2)+0.175 note 3 v 1, 2 single-ended high-level for ck, ck (v dd /2)+0.175 note 3 v 1, 2 v sel single-ended low-level for strobes note 3 (v dd /2)-0.175 v1, 2 single-ended low-level for ck, ck note 3 (v dd /2)-0.175 v1, 2 v dd or v ddq v seh min v dd /2 or v ddq /2 v sel max v seh v ss or v ssq v sel ck or dqs time - 17 - datasheet ddr3 sdram rev. 1.0 registered dimm 13.3.4 differential input cross point voltage to guarantee tight setup and hold times as well as output skew para meters with respect to clock and strobe, each cross point vo ltage of differential input signals (ck, ck and dqs, dqs ) must meet the requirements in below table. the differential input cross point voltage v ix is measured from the actual cross point of true and complement signal to the mid level between of v dd and v ss . figure 4. v ix definition [ table 6 ] cross point voltage for differential input signals (ck, dqs) note : 1. extended range for v ix is only allowed for clock and if single-ended clock input signals ck and ck are monotonic, have a single-ended swing v sel / v seh of at least v dd /2 250 mv, and the differential slew rate of ck-ck is larger than 3 v/ ns. 2. the relation between v ix min/max and v sel /v seh should satisfy following. (v dd /2) + v ix (min) - v sel 25mv v seh - ((v dd /2) + v ix (max)) 25mv 13.4 slew rate definition for single ended input signals see "address / command setup, hold and derating" for si ngle-ended slew rate definitions for address and command signals. see "data setup, hold and slew rate derating" fo r single-ended slew rate definitions for data signals. 13.5 slew rate definition for differential input signals input slew rate for differential signals (ck, ck and dqs, dqs ) are defined and measured as shown in below. [ table 7 ] differential input slew rate definition note : the differential signal (i.e. ck - ck and dqs - dqs ) must be linear between these thresholds figure 5. differential input slew rate definition for dqs, dqs and ck, ck symbol parameter ddr3-800/1066/1333/1600/1866 unit note min max v ix differential input cross point voltage relative to v dd /2 for ck,ck -150 150 mv 2 -175 175 mv 1 v ix differential input cross point voltage relative to v dd /2 for dqs,dqs -150 150 mv 2 description measured defined by from to differential input slew rate for rising edge (ck-ck and dqs-dqs ) v ildiffmax v ihdiffmin v ihdiffmin - v ildiffmax delta trdiff differential input slew rate for falling edge (ck-ck and dqs-dqs ) v ihdiffmin v ildiffmax v ihdiffmin - v ildiffmax delta tfdiff v dd ck , dqs v dd /2 ck, dqs v ss v ix v ix v ix v ihdiffmin 0 v ildiffmax delta trdiff delta tfdiff - 18 - datasheet ddr3 sdram rev. 1.0 registered dimm 14. ac & dc output measurement levels 14.1 single ended ac and dc output levels [ table 8 ] single ended ac and dc output levels note : 1. the swing of +/-0.1 x v ddq is based on approximately 50% of the static single ended output high or low swing with a driver impedance of 40 and an effective test load of 25 to v tt =v ddq /2. 14.2 differential ac and dc output levels [ table 9 ] differential ac and dc output levels note : 1. the swing of +/-0.2xv ddq is based on approximately 50% of the static single ended output high or low swing with a driver impedance of 40 and an effective test load of 25 to v tt =v ddq /2 at each of the differential outputs. 14.3 single-ended output slew rate with the reference load for timing measurements, output slew rate for falling and rising edges is defined and measured between v ol (ac) and v oh (ac) for single ended signals as shown in below. [ table 10 ] single ended output slew rate definition note : output slew rate is verified by design and charac terization, and may not be s ubject to production test. [ table 11 ] single ended output slew rate description : sr : slew rate q : query output (like in dq, which stands for data-in, query-output) se : single-ended signals for ron = rzq/7 setting note : 1) in two cased, a maximum slew rate of 6v/ns applies for a single dq signal within a byte lane. - case_1 is defined for a single dq signal within a byte lane whic h is switching into a certain direction (either from high to low of low to high) while all remaining dq signals in the same byte lane are static (i.e they stay at either high or low). - case_2 is defined for a single dq signals in the same byte la ne are switching into the opposite direction (i.e. from low to h igh or high to low respectively). for the remaining dq signal switching into the opposite direction, the regular maximum limit of 5 v/ns applies. figure 6. single-ended output slew rate definition symbol parameter ddr3-800/1066/1333/1600/1866 units note v oh (dc) dc output high measurement level (for iv curve linearity) 0.8 x v ddq v v om (dc) dc output mid measurement level (for iv curve linearity) 0.5 x v ddq v v ol (dc) dc output low measurement level (for iv curve linearity) 0.2 x v ddq v v oh (ac) ac output high measurement level (for output sr) v tt + 0.1 x v ddq v1 v ol (ac) ac output low measurement level (for output sr) v tt - 0.1 x v ddq v1 symbol parameter ddr3-800/1066/1333/1600/1866 units note v ohdiff (ac) ac differential output high measurement level (for output sr) +0.2 x v ddq v1 v oldiff (ac) ac differential output low measurement level (for output sr) -0.2 x v ddq v1 description measured defined by from to single ended output slew rate for rising edge v ol (ac) v oh (ac) v oh (ac)-v ol (ac) delta trse single ended output slew rate for falling edge v oh (ac) v ol (ac) v oh (ac)-v ol (ac) delta tfse parameter symbol ddr3-800 ddr3-1066 ddr3-1333 ddr3-1600 ddr3-1866 units min max min max min max min max min max single ended output slew rate srqse 2.5 5 2.5 5 2.5 5 2.5 5 2.5 5 1) v/ns v oh(ac) v ol(ac) delta trse delta tfse v tt - 19 - datasheet ddr3 sdram rev. 1.0 registered dimm 14.4 differential output slew rate with the reference load for timing measurements, output slew rate for falling and rising edges is defined and measured between v oldiff (ac) and v oh- diff (ac) for differential signals as shown in below. [ table 12 ] differential output slew rate definition note : output slew rate is verified by design and charac terization, and may not be s ubject to production test. [ table 13 ] differential output slew rate description : sr : slew rate q : query output (like in dq, which stands for data-in, query-output) diff : differential signals for ron = rzq/7 setting figure 7. differential output slew rate definition description measured defined by from to differential output slew rate for rising edge v oldiff (ac) v ohdiff (ac) v ohdiff (ac)-v oldiff (ac) delta trdiff differential output slew rate for falling edge v ohdiff (ac) v oldiff (ac) v ohdiff (ac)-v oldiff (ac) delta tfdiff parameter symbol ddr3-800 ddr3-1066 ddr3-1333 ddr3-1600 ddr3-1866 units min max min max min max min max min max differential output slew rate srqdiff 5 10 5 10 5 10 5 10 5 12 v/ns v ohdiff (ac) v oldiff (ac) delta trdiff delta tfdiff v tt - 20 - datasheet ddr3 sdram rev. 1.0 registered dimm 15. dimm idd specification definition symbol description idd0 operating one bank active-precharge current cke: high; external clock: on; tck, nrc, nras, cl: refer to component datasheet for detail pattern ; bl : 8 1) ; al : 0; cs : high between act and pre; command, address, bank address inputs: partially toggling ; data io: floating; dm: stable at 0; bank activity: cycling with one bank active at a time: 0,0,1,1,2,2,... ; output buffer and rtt: enabled in mode registers 2) ; odt signal: stable at 0; pattern details: refer to component datasheet for detail pat- tern idd1 operating one bank active-read-precharge current cke: high; external clock: on; tck, nrc, nras, nrcd, cl: refer to component datasheet for detail pattern ; bl : 8 1) ; al : 0; cs : high between act, rd and pre; command, address, bank address inputs, data io: partially toggling ; dm: stable at 0; bank activity: cycling with one bank active at a time: 0,0,1,1,2,2,... ; output buffer and rtt: enabled in mode registers 2) ; odt signal: stable at 0; pattern details: refer to component datasheet for detail pat- tern idd2n precharge standby current cke: high; external clock: on; tck, cl: refer to component datasheet for detail pattern ; bl: 8 1) ; al: 0; cs : stable at 1; command, address, bank address inputs: partially toggling ; data io: floating; dm: stable at 0; bank activity: all banks closed; output buffer and rtt: enabled in mode registers 2) ; odt signal: stable at 0; pattern details: refer to component datasheet for detail pattern idd2p0 precharge power-down current slow exit cke: low; external clock: on; tck, cl: refer to component datasheet for detail pattern ; bl: 8 1) ; al: 0; cs : stable at 1; command, address, bank address inputs: stable at 0; data io: floating; dm: stable at 0; bank activity: all banks closed; output buffer and rtt: enabled in mode registers 2) ; odt signal: stable at 0; precharge power down mode: slow exit 3) idd2p1 precharge power-down current fast exit cke: low; external clock: on; tck, cl: refer to component datasheet for detail pattern ; bl: 8 1) ; al: 0; cs : stable at 1; command, address, bank address inputs: stable at 0; data io: floating; dm: stable at 0; bank activity: all banks closed; output buffer and rtt: enabled in mode registers 2) ; odt signal: stable at 0; precharge power down mode: fast exit 3) idd2q precharge quiet standby current cke: high; external clock: on; tck, cl: refer to component datasheet for detail pattern ; bl: 8 1) ; al: 0; cs : stable at 1; command, address, bank address inputs: stable at 0; data io: floating; dm: stable at 0; bank activity: all banks closed; output buffer and rtt: enabled in mode registers 2) ; odt signal: stable at 0 idd3n active standby current cke: high; external clock: on; tck, cl: refer to component datasheet for detail pattern ; bl: 8 1) ; al: 0; cs : stable at 1; command, address, bank address inputs: partially toggling ; data io: floating; dm: stable at 0; bank activity: all banks open; output buffer and rtt: enabled in mode registers 2) ; odt signal: stable at 0; pattern details: refer to component datasheet for detail pattern idd3p active power-down current cke: low; external clock: on; tck, cl: refer to component datasheet for detail pattern ; bl: 8 1) ; al: 0; cs : stable at 1; command, address, bank address inputs: stable at 0; data io: floating; dm :stable at 0; bank activity: all banks open; output buffer and rtt: enabled in mode registers 2) ; odt signal: stable at 0 idd4r operating burst read current cke: high; external clock: on; tck, cl: refer to component datasheet for detail pattern ; bl: 8 1) ; al: 0; cs : high between rd; command, address, bank address inputs: partially toggling ; data io: seamless read data burst with different data between one burst and the next one ; dm: stable at 0; bank activity: all banks open, rd commands cycling through banks: 0,0,1,1,2,2,... ; output buffer and rtt: enabled in mode registers 2) ; odt signal: stable at 0; pattern details: refer to component datasheet for detail pattern idd4w operating burst write current cke: high; external clock: on; tck, cl: refer to component datasheet for detail pattern ; bl: 8 1) ; al: 0; cs : high between wr; command, address, bank address inputs: partially toggling ; data io: seamless write data burst with different data between one burst and the next one ; dm: stable at 0; bank activity: all banks open, wr commands cycling through banks: 0,0,1,1,2,2,... ; output buffer and rtt: enabled in mode registers 2) ; odt signal: stable at high ; pattern details: refer to component datasheet for detail pattern idd5b burst refresh current cke: high; external clock: on; tck, cl, nrfc: refer to component datasheet for detail pattern ; bl: 8 1) ; al: 0; cs : high between ref; command, address, bank address inputs: partially toggling ; data io: floating; dm: stable at 0; bank activity: ref command every nrfc ; output buffer and rtt: enabled in mode registers 2) ; odt signal: stable at 0; pattern details: refer to component datasheet for detail pattern idd6 self refresh current: normal temperature range tcase: 0 - 85c; auto self-refresh (asr): disabled 4) ; self-refresh temperature range (srt): n ormal 5) ; cke: low; external clock: off; ck and ck : low; cl: refer to component datasheet for detail pattern ; bl: 8 1) ; al: 0; cs , command, address, bank address, data io: floating; dm: stable at 0; bank activity: self-refresh operation; output buffer and rtt: enabled in mode registers 2) ; odt signal: floating idd6et self-refresh current: extended temperature range (optional) 6) tcase: 0 - 95c; auto self-refresh (asr): disabled 4) ; self-refresh temperature range (srt): extended 5) ; cke: low; external clock: off; ck and ck : low; cl: refer to component datasheet for detail pattern ; bl: 8 1) ; al: 0; cs , command, address, bank address, data io: floating; dm: stable at 0; bank activity: extended temperature self-refresh operation; output buffer and rtt: enabled in mode registers 2) ; odt signal: floating idd7 operating bank interleave read current cke: high; external clock: on; tck, nrc, nras, nrcd, nrrd, nfaw, cl: refer to component datasheet for detail pattern ; bl: 8 1) ; al: cl-1; cs : high between act and rda; command, address, bank address inputs: partially toggling ; data io: read data bursts with different data between one burst and the next one ; dm: stable at 0; bank activity: two times interleaved cycling through banks (0, 1, ...7) with different addressing ; output buffer and rtt: enabled in mode registers 2) ; odt signal: stable at 0; pattern details: refer to component datasheet for detail pattern idd8 reset low current reset : low; external clock : off; ck and ck : low; cke : floating ; cs , command, address, bank address, data io : floating ; odt signal : floating - 21 - datasheet ddr3 sdram rev. 1.0 registered dimm note : 1) burst length: bl8 fixed by mrs: set mr0 a[1,0]=00b 2) output buffer enable: set mr1 a[12] = 0b; set mr1 a[5,1] = 01 b; rtt_nom enable: set mr1 a[9,6,2] = 011b; rtt_wr enable: set mr2 a[10,9] = 10b 3) precharge power down mode: set mr0 a12=0b for slow exit or mr0 a12=1b for fast exit 4) auto self-refresh (asr): set mr2 a6 = 0b to disable or 1b to enable feature 5) self-refresh temperature range (srt): set mr2 a7=0b for normal or 1b for extended temperature range 6) refer to dram supplier data sheet and/or dimm spd to determine if optional features or requirements are supported by ddr3 sd ram device 7) idd current measure method and detail patterns are described on ddr3 component datasheet 8) vdd and vddq are merged on module pcb. 9) dimm idd spec is measured with qoff condition (iddq values are not considered) - 22 - datasheet ddr3 sdram rev. 1.0 registered dimm 16. idd spec table M393B2G70CB0 : 16gb(2gx72) module note : 1. dimm idd spec is calculated with consid ering de-actived rank(idle) is idd2n. symbol ck0 (ddr3-1600@cl=11) cma (ddr3-1866@cl=13) unit note idd0 1570 1570 ma 1 idd1 1740 1740 ma 1 idd2p0(slow exit) 896 896 ma idd2p1(fast exit) 896 896 ma idd2n 1260 1260 ma idd2q 1070 1070 ma idd3p 1070 1070 ma idd3n 1440 1440 ma idd4r 2280 2460 ma 1 idd4w 2280 2460 ma 1 idd5b 4410 4410 ma 1 idd6 560 560 ma idd7 3370 3460 ma 1 idd8 560 560 ma - 23 - datasheet ddr3 sdram rev. 1.0 registered dimm 17. input/output capacitance [ table 14 ] input/output capacitance note : this parameter is component input/output capacitance so that is different from module level capacitance. 1. although the dm, tdqs and tdqs pins have different functions, the loading matches dq and dqs 2. this parameter is not subject to production test. it is verified by design and characterization. the capacitance is measured according to jep147("procedure for me asuring input capacitance using a vector network analyzer( vna )") with v dd , v ddq , v ss , v ssq applied and all other pins floating (except the pin under test, cke, reset and odt as necessary). v dd =v ddq =1.5v, v bias =v dd /2 and on-die termination off. 3. this parameter applies to monolithic devices only; stacked/dual-die devices are not covered here 4. absolute value of cck- cck 5. absolute value of cio(dqs)-cio( dqs ) 6. ci applies to odt, cs , cke, a0-a15, ba0-ba2, ras , cas , we . 7. cdi_ctrl applies to odt, cs and cke 8. cdi_ctrl=ci(ctrl)-0.5*(ci(clk)+ci( clk )) 9. cdi_add_cmd applies to a0-a15, ba0-ba2, ras , cas and we 10. cdi_add_cmd=ci(add_cmd) - 0.5*(ci(clk)+ci( clk )) 11. cdio=cio(dq,dm) - 0.5*(cio(dqs)+cio( dqs )) 12. maximum external load capacitance on zq pin: 5pf parameter symbol ddr3-800 ddr3-1066 ddr3-1333 ddr3-1600 ddr3-1866 units note min max min max min max min max min max input/output capacitance (dq, dm, dqs, dqs , tdqs, tdqs ) cio 1.4 3.0 1.4 2.7 1.4 2.5 1.4 2.3 1.4 2.2 pf 1,2,3 input capacitance (ck and ck) cck 0.8 1.6 0.8 1.6 0.8 1.4 0.8 1.4 0.8 1.3 pf 2,3 input capacitance delta (ck and ck) cdck 0 0.15 0 0.15 0 0.15 0 0.15 0 0.15 pf 2,3,4 input capacitance (all other input-only pins) ci 0.75 1.4 0.75 1.35 0.75 1.3 0.75 1.3 0.75 1.2 pf 2,3,6 input capacitance delta (dqs and dqs) cddqs 0 0.2 0 0.2 0 0.15 0 0.15 0 0.15 pf 2,3,5 input capacitance delta (all control input-only pins) cdi_ctrl -0.5 0.3 -0.5 0.3 -0.4 0.2 -0.4 0.2 -0.4 0.2 pf 2,3,7,8 input capacitance delta (all add and cmd input-only pins) cdi_add_cmd -0.5 0.5 -0.5 0.5 -0.4 0.4 -0.4 0.4 -0.4 0.4 pf 2,3,9,10 input/output capacitance delta (dq, dm, dqs, dqs , tdqs, tdqs ) cdio -0.5 0.3 -0.5 0.3 -0.5 0.3 -0.5 0.3 -0.5 0.3 pf 2,3,11 input/output capacitance of zq pin czq - 3 - 3 - 3 - 3 - 3 pf 2, 3, 12 - 24 - datasheet ddr3 sdram rev. 1.0 registered dimm 18. electrical characteristics and ac timing (0 c - 26 - datasheet ddr3 sdram rev. 1.0 registered dimm [ table 18 ] ddr3-1600 speed bins speed ddr3-1600 units note cl-nrcd-nrp 11-11-11 parameter symbol min max intermal read command to first data taa 13.75 (13.125) 9 20 ns act to internal read or write delay time trcd 13.75 (13.125) 9 - ns pre command period trp 13.75 (13.125) 9 - ns act to act or ref command period trc 48.75 (48.125) 9 - ns act to pre command period tras 35 9*trefi ns cl = 6 cwl = 5 tck(avg) 2.5 3.3 ns 1,2,3,7 cwl = 6 tck(avg) reserved ns 1,2,3,4,7 cwl = 7, 8 tck(avg) reserved ns 4 cl = 7 cwl = 5 tck(avg) reserved ns 4 cwl = 6 tck(avg) 1.875 <2.5 ns 1,2,3,4,7 cwl = 7 tck(avg) reserved ns 1,2,3,4,7 cwl = 8 tck(avg) reserved ns 4 cl = 8 cwl = 5 tck(avg) reserved ns 4 cwl = 6 tck(avg) 1.875 <2.5 ns 1,2,3,7 cwl = 7 tck(avg) reserved ns 1,2,3,4,7 cwl = 8 tck(avg) reserved ns 1,2,3,4 cl = 9 cwl = 5,6 tck(avg) reserved ns 4 cwl = 7 tck(avg) 1.5 <1.875 ns 1,2,3,4,7 cwl = 8 tck(avg) reserved ns 1,2,3,4 cl = 10 cwl = 5,6 tck(avg) reserved ns 4 cwl = 7 tck(avg) 1.5 <1.875 ns 1,2,3,7 cwl = 8 tck(avg) reserved ns 1,2,3,4 cl = 11 cwl = 5,6,7 tck(avg) reserved ns 4 cwl = 8 tck(avg) 1.25 <1.5 ns 1,2,3,9 supported cl settings 6,7,8,9,10,11 nck supported cwl settings 5,6,7,8 nck - 27 - datasheet ddr3 sdram rev. 1.0 registered dimm [ table 19 ] ddr3-1866 speed bins speed ddr3-1866 units note cl-nrcd-nrp 13-13-13 parameter symbol min max internal read command to first data taa 13.91 (13.125) 10 20 ns act to internal read or write delay time trcd 13.91 (13.125) 10 - ns pre command period trp 13.91 (13.125) 10 - ns act to act or ref command period trc 47.91 (47.125) 10 - ns act to pre command period tras 34 9*trefi ns cl = 6 cwl = 5 tck(avg) 2.5 3.3 ns 1,2,3,8 cwl = 6 tck(avg) reserved ns 1,2,3,4,8 cwl = 7,8,9 tck(avg) reserved ns 4 cl = 7 cwl = 5 tck(avg) reserved ns 4 cwl = 6 tck(avg) 1.875 2.5 ns 1,2,3,4,8 cwl = 7,8,9 tck(avg) reserved ns 4 cl = 8 cwl = 5 tck(avg) reserved ns 4 cwl = 6 tck(avg) 1.875 <2.5 ns 1,2,3,8 cwl = 7 tck(avg) reserved ns 1,2,3,4,8 cwl = 8,9 tck(avg) reserved ns 4 cl = 9 cwl = 5,6 tck(avg) reserved ns 4 cwl = 7 tck(avg) 1.5 1.875 ns 1,2,3,4,8 cwl = 8 tck(avg) reserved ns 4 cwl = 9 tck(avg) reserved ns 4 cl = 10 cwl = 5,6 tck(avg) reserved ns 4 cwl = 7 tck(avg) 1.5 <1.875 ns 1,2,3,8 cwl = 8 tck(avg) reserved ns 1,2,3,4,8 cl = 11 cwl = 5,6,7 tck(avg) reserved ns 4 cwl = 8 tck(avg) 1.25 1.5 ns 1,2,3,4,8 cwl = 9 tck(avg) reserved ns 1,2,3,4 cl = 12 cwl = 5,6,7,8 tck(avg) reserved ns 4 cwl = 9 tck(avg) reserved ns 1,2,3,4 cl = 13 cwl = 5,6,7,8 tck(avg) reserved ns 4 cwl = 9 tck(avg) 1.071 <1.25 ns 1,2,3,9 supported cl settings 6,7,8,9,10,11,13 nck supported cwl settings 5,6,7,8,9 nck - 28 - datasheet ddr3 sdram rev. 1.0 registered dimm 18.3.1 speed bin table notes absolute specification (t oper ; v ddq = v dd = 1.5v +/- 0.075 v); note : 1. the cl setting and cwl setting result in tck(avg).min and tck(avg).max requirements. when making a selection of tck(avg), bo th need to be fulfilled: requirements from cl setting as well as requirements from cwl setting. 2. tck(avg).min limits: since cas latency is not purely analog - data and strobe output are synchronized by the dll - all possi ble intermediate frequencies may not be guar- anteed. an application should use the next smaller jedec standard tck(avg) value (2.5, 1.875, 1.5, or 1.25 ns) when calculating cl [nck] = taa [ns] / tck(avg) [ns], rounding up to the next "supportedcl". 3. tck(avg).max limits: calculate tck(avg) = taa.max / cl selected and round the resulting tck(avg) down to the next valid spee d bin (i.e. 3.3ns or 2.5ns or 1.875 ns or 1.25 ns). this result is tck(avg) .max corresponding to cl selected. 4. "reserved" settings are not allowed. user must program a different value. 5. any ddr3-1066 speed bin also supports functional operation at lower frequencies as shown in the table which are not subject to production tests but verified by design/ characterization. 6. any ddr3-1333 speed bin also supports functional operation at lower frequencies as shown in the table which are not subject to production tests but verified by design/ characterization. 7. any ddr3-1600 speed bin also supports functional operation at lower frequencies as shown in the table which are not subject to production tests but verified by design/ characterization. 8. any ddr3-1866 speed bin also supports functional operation at lower frequencies as shown in the table which are not subject to production tests but verified by design/ characterization. 9. for devices supporting optional downshift to cl=7 and cl=9, taa/trcd/trp min must be 13.125 ns or lower. spd settings must b e programmed to match. for example, ddr3-1333(cl9) devices supporting downshift to ddr3-1066(cl7) should program 13.125 ns in spd bytes for taamin (byte 16), trcdm in (byte 18), and trpmin (byte 20). ddr3-1600(cl11) devices supporting downshift to ddr3-1333(cl 9) or ddr3-1066(cl7) should program 13.125 ns in spd bytes for taamin (byte16), trcdmin (byte 18), and trpmin (byte 20). ddr3-1866(cl13) devices supporting downshift to ddr3-1600(cl11) or ddr3-1333(cl9) or ddr3-1066(cl7) should program 13.125 ns in spd bytes for taamin (byte16), trcdmin (byte 18), and trpmin (byte 20). ddr3-1600 devices supporting down binning to ddr3-1333 or ddr3-1066 should program 13.125ns in spd byte for taamin (byte 16), trcdmin (byte 18) and trpmin (byte 20). once trp (byte 20) is programmed to 13.125n s, trcmin (byte 21,23) also should be programmed accodingly. for example, 49.125ns, (trasmin + tr pmin = 36ns + 13.125ns) for ddr3-1333 and 48.125ns (trasmin + trpmi n = 35ns + 13.125ns) for ddr3- 1600. 10. for devices supporting optional down binning to cl=11, cl=9 and cl=7, taa/trcd/trpmin must be 13.125ns. spd setting must b e programed to match. for example, ddr3-1866 devices supporting down binning to ddr3-1600 or ddr3-1333 or 1066 should program 13.125ns in spd bytes for taamin(byt e16), trcdmin(byte18) and trp- min (byte20). once trp (byte20) is programmed to 13.125ns, trcmin (byte21,23) also should be programmed accordingly. for exam ple, 47.125ns (trasmin + trpmin = 34ns + 13.125ns) - 29 - datasheet ddr3 sdram rev. 1.0 registered dimm 19. timing parameters by speed grade [ table 20 ] timing parameters by speed bins for ddr3-800 to ddr3-1333 (cont.) speed ddr3-800 ddr3-1066 ddr3-1333 units note parameter symbol min max min max min max clock timing minimum clock cycle time (dll off mode) tck(dll_off) 8 - 8 - 8 - ns 6 average clock period tck(avg) see speed bins table ps clock period tck(abs) tck(avg)min + tjit(per)min tck(avg)max + tjit(per)max tck(avg)min + tjit(per)min tck(avg)max + tjit(per)max tck(avg)min + tjit(per)min tck(avg)max + tjit(per)max ps average high pulse width tch(avg) 0.47 0.53 0.47 0.53 0.47 0.53 tck(avg) average low pulse width tcl(avg) 0.47 0.53 0.47 0.53 0.47 0.53 tck(avg) clock period jitter tjit(per) -100 100 -90 90 -80 80 ps clock period jitter during dll locking period tjit(per, lck) -90 90 -80 80 -70 70 ps cycle to cycle period jitter tjit(cc) 200 180 160 ps cycle to cycle period jitter during dll locking period tjit(cc, lck) 180 160 140 ps cumulative error across 2 cycles terr(2per) - 147 147 - 132 132 - 118 118 ps cumulative error across 3 cycles terr(3per) - 175 175 - 157 157 - 140 140 ps cumulative error across 4 cycles terr(4per) - 194 194 - 175 175 - 155 155 ps cumulative error across 5 cycles terr(5per) - 209 209 - 188 188 - 168 168 ps cumulative error across 6 cycles terr(6per) - 222 222 - 200 200 - 177 177 ps cumulative error across 7 cycles terr(7per) - 232 232 - 209 209 - 186 186 ps cumulative error across 8 cycles terr(8per) - 241 241 - 217 217 - 193 193 ps cumulative error across 9 cycles terr(9per) - 249 249 - 224 224 - 200 200 ps cumulative error across 10 cycles terr(10per) - 257 257 - 231 231 - 205 205 ps cumulative error across 11 cycles terr(11per) - 263 263 - 237 237 - 210 210 ps cumulative error across 12 cycles terr(12per) - 269 269 - 242 242 - 215 215 ps cumulative error across n = 13, 14 ... 49, 50 cycles terr(nper) terr(nper)min = (1 + 0.68ln(n))*tjit(per)min terr(nper)max = (1 + 0.68ln(n))*tjit(per)max ps 24 absolute clock high pulse width tch(abs) 0.43 - 0.43 - 0.43 - tck(avg) 25 absolute clock low pulse width tcl(abs) 0.43 - 0.43 - 0.43 - tck(avg) 26 data timing dqs,dqs to dq skew, per group, per access tdqsq - 200 - 150 - 125 ps 13 dq output hold time from dqs, dqs tqh 0.38 - 0.38 - 0.38 - tck(avg) 13, g dq low-impedance time from ck, ck tlz(dq) -800 400 -600 300 -500 250 ps 13,14, f dq high-impedance time from ck, ck thz(dq) - 400 - 300 - 250 ps 13,14, f data setup time to dqs, dqs referenced to v ih (ac)v il (ac) levels tds(base) ac175 75 - 25 - - - ps d, 17 tds(base) ac150 125 - 75 - 30 - ps d, 17 data hold time to dqs, dqs referenced to v ih (dc)v il (dc) levels tdh(base) dc100 150 - 100 - 65 - ps d, 17 dq and dm input pulse width for each input tdipw 600 - 490 - 400 - ps 28 data strobe timing dqs, dqs differential read preamble trpre 0.9 note 19 0.9 note 19 0.9 note 19 tck(avg) 13, 19, g dqs, dqs differential read postamble trpst 0.3 note 11 0.3 note 11 0.3 note 11 tck(avg) 11, 13, b dqs, dqs differential output high time tqsh 0.38 - 0.38 - 0.4 - tck(avg) 13, g dqs, dqs differential output low time tqsl 0.38 - 0.38 - 0.4 - tck(avg) 13, g dqs, dqs differential write preamble twpre 0.9 - 0.9 - 0.9 - tck(avg) dqs, dqs differential write postamble twpst 0.3 - 0.3 - 0.3 - tck(avg) dqs, dqs rising edge output access time from rising ck, ck tdqsck -400 400 -300 300 -255 255 ps 13,f dqs, dqs low-impedance time (referenced from rl-1) tlz(dqs) -800 400 -600 300 -500 250 ps 13,14,f dqs, dqs high-impedance time (referenced from rl+bl/2) thz(dqs) - 400 - 300 - 250 ps 12,13,14 dqs, dqs differential input low pulse width tdqsl 0.45 0.55 0.45 0.55 0.45 0.55 tck(avg) 29, 31 dqs, dqs differential input high pulse width tdqsh 0.45 0.55 0.45 0.55 0.45 0.55 tck(avg) 30, 31 dqs, dqs rising edge to ck, ck rising edge tdqss -0.25 0.25 -0.25 0.25 -0.25 0.25 tck(avg) c dqs,dqs falling edge setup time to ck, ck rising edge tdss 0.2 - 0.2 - 0.2 - tck(avg) c, 32 dqs,dqs falling edge hold time to ck, ck rising edge tdsh 0.2 - 0.2 - 0.2 - tck(avg) c, 32 - 30 - datasheet ddr3 sdram rev. 1.0 registered dimm [ table 20 ] timing parameters by speed bins for ddr3-800 to ddr3-1333 (cont.) speed ddr3-800 ddr3-1066 ddr3-1333 units note parameter symbol min max min max min max command and address timing dll locking time tdllk 512 - 512 - 512 - nck internal read command to precharge command delay trtp max (4nck,7.5ns) - max (4nck,7.5ns) - max (4nck,7.5ns) - e delay from start of internal write transaction to internal read com- mand twtr max (4nck,7.5ns) - max (4nck,7.5ns) - max (4nck,7.5ns) - e,18 write recovery time twr 15 - 15 - 15 - ns e mode register set command cycle time tmrd 4 - 4 - 4 - nck mode register set command update delay tmod max (12nck,15ns) - max (12nck,15ns) - max (12nck,15ns) - cas to cas command delay tccd 4 - 4 - 4 - nck auto precharge write recovery + precharge time tdal(min) wr + roundup (trp / tck(avg)) nck multi-purpose register recovery time tmprr 1 - 1 - 1 - nck 22 active to precharge command period tras see ?speed bins and cl, trcd, trp, trc and tras for corresponding bin? on page 42 ns e active to active command period for 1kb page size trrd max (4nck,10ns) - max (4nck,7.5ns) - max (4nck,6ns) - e active to active command period for 2kb page size trrd max (4nck,10ns) - max (4nck,10ns) - max (4nck,7.5ns) - e four activate window for 1kb page size tfaw 40 - 37.5 - 30 - ns e four activate window for 2kb page size tfaw 50 - 50 - 45 - ns e command and address setup time to ck, ck referenced to v ih (ac) / v il (ac) levels tis(base) ac175 200 - 125 - 65 - ps b,16 tis(base) ac150 200+150 - 125+150 - 65+125 - ps b,16,27 command and address hold time from ck, ck referenced to v ih (dc) / v il (dc) levels tih(base) dc100 275 - 200 - 140 - ps b,16 control & address input pulse width for each input tipw 900 - 780 - 620 - ps 28 calibration timing power-up and reset calibration time tzqiniti 512 - 512 - 512 - nck normal operation full calibration time tzqoper 256 - 256 - 256 - nck normal operation short calibration time tzqcs 64 - 64 - 64 - nck 23 reset timing exit reset from cke high to a valid command txpr max(5nck, trfc + 10ns) - max(5nck, trfc + 10ns) - max(5nck, trfc + 10ns) - self refresh timing exit self refresh to commands not requiring a locked dll txs max(5nck,trf c + 10ns) - max(5nck,trf c + 10ns) - max(5nck,trf c + 10ns) - exit self refresh to commands requiring a locked dll txsdll tdllk(min) - tdllk(min) - tdllk(min) - nck minimum cke low width for self refresh entry to exit timing tckesr tcke(min) + 1tck - tcke(min) + 1tck - tcke(min) + 1tck - valid clock requirement after self refresh entry (sre) or power- down entry (pde) tcksre max(5nck, 10ns) - max(5nck, 10ns) - max(5nck, 10ns) - valid clock requirement before self refresh exit (srx) or power- down exit (pdx) or reset exit tcksrx max(5nck, 10ns) - max(5nck, 10ns) - max(5nck, 10ns) - - 31 - datasheet ddr3 sdram rev. 1.0 registered dimm [ table 20 ] timing parameters by speed bins for ddr3-800 to ddr3-1333 speed ddr3-800 ddr3-1066 ddr3-1333 units note parameter symbol min max min max min max power down timing exit power down with dll on to any valid command;exit pre- charge power down with dll frozen to commands not requiring a locked dll txp max (3nck, 7.5ns) - max (3nck, 7.5ns) - max (3nck,6ns) - exit precharge power down with dll frozen to commands re- quiring a locked dll txpdll max (10nck, 24ns) - max (10nck, 24ns) - max (10nck, 24ns) - 2 cke minimum pulse width tcke max (3nck, 7.5ns) - max (3nck, 5.625ns) - max (3nck, 5.625ns) - command pass disable delay tcpded 1 - 1 - 1 - nck power down entry to exit timing tpd tcke(min) 9*trefi tcke(min) 9*trefi tcke(min) 9*trefi tck(avg) 15 timing of act command to power down entry tactpden 1 - 1 - 1 - nck 20 timing of pre command to power down entry tprpden 1 - 1 - 1 - nck 20 timing of rd/rda command to power down entry trdpden rl + 4 +1 - rl + 4 +1 - rl + 4 +1 - timing of wr command to power down entry (bl8otf, bl8mrs, bc4otf) twrpden wl + 4 +(twr/ tck(avg)) - wl + 4 +(twr/ tck(avg)) - wl + 4 +(twr/ tck(avg)) - nck 9 timing of wra command to power down entry (bl8otf, bl8mrs, bc4otf) twrapden wl+4+wr +1 - wl+4+wr+1 - wl+4+wr+1 - nck 10 timing of wr command to power down entry (bc4mrs) twrpden wl + 2 +(twr/ tck(avg)) - wl + 2 +(twr/ tck(avg)) - wl + 2 +(twr/ tck(avg)) - nck 9 timing of wra command to power down entry (bc4mrs) twrapden wl +2 +wr +1 - wl +2 +wr +1 - wl +2 +wr +1 - nck 10 timing of ref command to power down entry trefpden 1 - 1 - 1 - 20,21 timing of mrs command to power down entry tmrspden tmod(min) - tmod(min) - tmod(min) - odt timing odt high time without write command or with write command and bc4 odth4 4 - 4 - 4 - nck odt high time with write command and bl8 odth8 6 - 6 - 6 - nck asynchronous rtt turn-on delay (power-down with dll fro- zen) taonpd 2 8.5 2 8.5 2 8.5 ns asynchronous rtt turn-off delay (power-down with dll fro- zen) taofpd 2 8.5 2 8.5 2 8.5 ns rtt turn-on taon -400 400 -300 300 -250 250 ps 7,f rtt_nom and rtt_wr turn-off time from odtloff reference taof 0.3 0.7 0.3 0.7 0.3 0.7 tck(avg) 8,f rtt dynamic change skew tadc 0.3 0.7 0.3 0.7 0.3 0.7 tck(avg) f write leveling timing first dqs/dqs rising edge after write leveling mode is pro- grammed twlmrd 40 - 40 - 40 - tck(avg) 3 dqs/dqs delay after write leveling mode is programmed twldqsen 25 - 25 - 25 - tck(avg) 3 write leveling setup time from rising ck, ck crossing to rising dqs, dqs crossing twls 325 - 245 - 195 - ps write leveling hold time from rising dqs, dqs crossing to rising ck, ck crossing twlh 325 - 245 - 195 - ps write leveling output delay twlo 0 9 0 9 0 9 ns write leveling output error twloe 0 2 0 2 0 2 ns - 32 - datasheet ddr3 sdram rev. 1.0 registered dimm [ table 21 ] timing parameters by speed bins for ddr3-1600, ddr3-1866 (cont.) speed ddr3-1600 ddr3-1866 units note parameter symbol min max min max clock timing minimum clock cycle time (dll off mode) tck(dll_off) 8 - 8 - ns 6 average clock period tck(avg) see speed bins table ps clock period tck(abs) tck(avg)min + tjit(per)min tck(avg)max + tjit(per)max tck(avg)min + tjit(per)min tck(avg)max + tjit(per)max ps average high pulse width tch(avg) 0.47 0.53 0.47 0.53 tck(avg) average low pulse width tcl(avg) 0.47 0.53 0.47 0.53 tck(avg) clock period jitter tjit(per) -70 70 -60 60 ps clock period jitter during dll locking period tjit(per, lck) -60 60 -50 50 ps cycle to cycle period jitter tjit(cc) 140 120 ps cycle to cycle period jitter during dll locking period tjit(cc, lck) 120 100 ps cumulative error across 2 cycles terr(2per) -103 103 -88 88 ps cumulative error across 3 cycles terr(3per) -122 122 -105 105 ps cumulative error across 4 cycles terr(4per) -136 136 -117 117 ps cumulative error across 5 cycles terr(5per) -147 147 -126 126 ps cumulative error across 6 cycles terr(6per) -155 155 -133 133 ps cumulative error across 7 cycles terr(7per) -163 163 -139 139 ps cumulative error across 8 cycles terr(8per) -169 169 -145 145 ps cumulative error across 9 cycles terr(9per) -175 175 -150 150 ps cumulative error across 10 cycles terr(10per) -180 180 -154 154 ps cumulative error across 11 cycles terr(11per) -184 184 -158 158 ps cumulative error across 12 cycles terr(12per) -188 188 -161 161 ps cumulative error across n = 13, 14 ... 49, 50 cycles terr(nper) terr(nper)min = (1 + 0.68ln(n))*tjit(per)min terr(nper)max = (1 + 0.68ln(n))*tjit(per)max ps 24 absolute clock high pulse width tch(abs) 0.43 - 0.43 - tck(avg) 25 absolute clock low pulse width tcl(abs) 0.43 - 0.43 - tck(avg) 26 data timing dqs,dqs to dq skew, per group, per access tdqsq - 100 - 85 ps 13 dq output hold time from dqs, dqs tqh 0.38 - 0.38 - tck(avg) 13, g dq low-impedance time from ck, ck tlz(dq) -450 225 -390 195 ps 13,14, f dq high-impedance time from ck, ck thz(dq) - 225 - 195 ps 13,14, f data setup time to dqs, dqs referenced to v ih (ac)v il (ac) lev- els tds(base) ac150 10 - - - ps d, 17 tds(base) ac135 - - 0 - ps d, 17 data hold time to dqs, dqs referenced to v ih (dc)v il (dc) levels tdh(base) dc100 45 - 20 - ps d, 17 dq and dm input pulse width for each input tdipw 360 - 320 - ps 28 data strobe timing dqs, dqs differential read preamble trpre 0.9 note 19 0.9 note 19 tck(avg) 13, 19, g dqs, dqs differential read postamble trpst 0.3 note 11 0.3 note 11 tck(avg) 11, 13, b dqs, dqs differential output high time tqsh 0.4 - 0.4 - tck(avg) 13, g dqs, dqs differential output low time tqsl 0.4 - 0.4 - tck(avg) 13, g dqs, dqs differential write preamble twpre 0.9 - 0.9 - tck(avg) dqs, dqs differential write postamble twpst 0.3 - 0.3 - tck(avg) dqs, dqs rising edge output access time from rising ck, ck tdqsck -225 225 -195 195 ps 13,f dqs, dqs low-impedance time (referenced from rl-1) tlz(dqs) -450 225 -390 195 ps 13,14,f dqs, dqs high-impedance time (referenced from rl+bl/2) thz(dqs) - 225 - 195 ps 12,13,14 dqs, dqs differential input low pulse width tdqsl 0.45 0.55 0.45 0.55 tck(avg) 29, 31 dqs, dqs differential input high pulse width tdqsh 0.45 0.55 0.45 0.55 tck(avg) 30, 31 dqs, dqs rising edge to ck, ck rising edge tdqss -0.27 0.27 -0.27 0.27 tck(avg) c dqs,dqs falling edge setup time to ck, ck rising edge tdss 0.18 - 0.18 - tck(avg) c, 32 dqs,dqs falling edge hold time to ck, ck rising edge tdsh 0.18 - 0.18 - tck(avg) c, 32 - 33 - datasheet ddr3 sdram rev. 1.0 registered dimm [ table 21 ] timing parameters by speed bins for ddr3-1600, ddr3-1866 (cont.) speed ddr3-1600 ddr3-1866 units note parameter symbol min max min max command and address timing dll locking time tdllk 512 - 512 - nck internal read command to precharge command delay trtp max (4nck,7.5ns) - max (4nck,7.5ns) - e delay from start of internal write transaction to internal read com- mand twtr max (4nck,7.5ns) - max (4nck,7.5ns) - e,18 write recovery time twr 15 - 15 - ns e mode register set command cycle time tmrd 4 - 4 - nck mode register set command update delay tmod max (12nck,15ns) - max (12nck,15ns) - cas to cas command delay tccd 4 - 4 - nck auto precharge write recovery + precharge time tdal(min) wr + roundup (trp / tck(avg)) nck multi-purpose register recovery time tmprr 1 - 1 - nck 22 active to precharge command period tras see ?speed bins and cl, trcd, trp, trc and tras for corresponding bin? on page 42 ns e active to active command period for 1kb page size trrd max (4nck,6ns) - max (4nck, 5ns) - e active to active command period for 2kb page size trrd max (4nck,7.5ns) - max (4nck, 6ns) - e four activate window for 1kb page size tfaw 30 - 27 - ns e four activate window for 2kb page size tfaw 40 - 35 - ns e command and address setup time to ck, ck referenced to v ih (ac) / v il (ac) levels tis(base) ac175 45 - - - ps b,16 tis(base) ac150 170 - - - ps b,16 tis(base) ac135 - - 65 ps b,16 tis(base) ac125 - - 150 - ps b,16,27 command and address hold time from ck, ck referenced to v ih (dc) / v il (dc) levels tih(base) dc100 120 - 100 - ps b,16 control & address input pulse width for each input tipw 560 - 535 - ps 28 calibration timing power-up and reset calibration time tzqiniti 512 - max(512nck,640ns) - nck normal operation full calibration time tzqoper 256 - max(256nck,320ns) - nck normal operation short calibration time tzqcs 64 - max(64nck,80ns) - nck 23 reset timing exit reset from cke high to a valid command txpr max(5nck, trfc + 10ns) - max(5nck, trfc + 10ns) - self refresh timing exit self refresh to commands not requiring a locked dll txs max(5nck,trfc + 10ns) - max(5nck,trfc + 10ns) - exit self refresh to commands requiring a locked dll txsdll tdllk(min) - tdllk(min) - nck minimum cke low width for self refresh entry to exit timing tckesr tcke(min) + 1tck - tcke(min) + 1nck - valid clock requirement after self refresh entry (sre) or power- down entry (pde) tcksre max(5nck, 10ns) - max(5nck, 10ns) - valid clock requirement before self refresh exit (srx) or power- down exit (pdx) or reset exit tcksrx max(5nck, 10ns) - max(5nck, 10ns) - - 34 - datasheet ddr3 sdram rev. 1.0 registered dimm [ table 21 ] timing parameters by speed bins for ddr3-1600, ddr3-1866 speed ddr3-1600 ddr3-1866 units note parameter symbol min max min max power down timing exit power down with dll on to any valid command;exit pre- charge power down with dll frozen to commands not requiring a locked dll txp max (3nck,6ns) - max(3nck,6ns) - exit precharge power down with dll frozen to commands re- quiring a locked dll txpdll max (10nck, 24ns) - max(10nck,24ns) - 2 cke minimum pulse width tcke max (3nck,5ns) - max(3nck,5ns) - command pass disable delay tcpded 1 - 2 - nck power down entry to exit timing tpd tcke(min) 9*trefi tcke(min) 9*trefi tck(avg) 15 timing of act command to power down entry tactpden 1 - 1 - nck 20 timing of pre command to power down entry tprpden 1 - 1 - nck 20 timing of rd/rda command to power down entry trdpden rl + 4 +1 - rl + 4 +1 - timing of wr command to power down entry (bl8otf, bl8mrs, bc4otf) twrpden wl + 4 +(twr/ tck(avg)) - wl + 4 +(twr/ tck(avg)) - nck 9 timing of wra command to power down entry (bl8otf, bl8mrs, bc4otf) twrapden wl + 4 +wr +1 - wl + 4 +wr +1 - nck 10 timing of wr command to power down entry (bc4mrs) twrpden wl + 2 +(twr/ tck(avg)) - wl + 2 +(twr/ tck(avg)) - nck 9 timing of wra command to power down entry (bc4mrs) twrapden wl +2 +wr +1 - wl +2 +wr +1 - nck 10 timing of ref command to power down entry trefpden 1 - 1 - 20,21 timing of mrs command to power down entry tmrspden tmod(min) - tmod(min) - odt timing odt high time without write command or with write command and bc4 odth4 4 - 4 - nck odt high time with write command and bl8 odth8 6 - 6 - nck asynchronous rtt turn-on delay (power-down with dll fro- zen) taonpd 2 8.5 2 8.5 ns asynchronous rtt turn-off delay (power-down with dll fro- zen) taofpd 2 8.5 2 8.5 ns rtt turn-on taon -225 225 -195 195 ps 7,f rtt_nom and rtt_wr turn-off time from odtloff reference taof 0.3 0.7 0.3 0.7 tck(avg) 8,f rtt dynamic change skew tadc 0.3 0.7 0.3 0.7 tck(avg) f write leveling timing first dqs/dqs rising edge after write leveling mode is pro- grammed twlmrd 40 - 40 - tck(avg) 3 dqs/dqs delay after write leveling mode is programmed twldqsen 25 - 25 - tck(avg) 3 write leveling setup time from rising ck, ck crossing to rising dqs, dqs crossing twls 165 - 140 - ps write leveling hold time from rising dqs, dqs crossing to rising ck, ck crossing twlh 165 - 140 - ps write leveling output delay twlo 0 7.5 0 7.5 ns write leveling output error twloe 0 2 0 2 ns - 35 - datasheet ddr3 sdram rev. 1.0 registered dimm 19.1 jitter notes specific note a unit ?tck(avg)? represents the actual tck(avg) of the input cl ock under operation. unit ?nck? represents one clock cycle of the input clock, counting the actual clock edges .ex) tmrd = 4 [nck] means; if one mode register set command is registered at tm, another mode register set command may be registered at tm +4, even if (tm+4 - tm) is 4 x tck(avg) + terr(4per),min. specific note b these parameters are measured from a command/address signal (cke, cs , ras , cas , we , odt, ba0, a0, a1, etc.) transition edge to its respective clock signal (ck/ck ) crossing. the spec values are not affect ed by the amount of clock jitter applied (i.e. tjit(per), tjit(cc), etc.), as the setup and hold are relative to the clock signal crossing that latches the command/address. t hat is, these parameters should be met whether clock jitter is present or not. specific note c these parameters are measured from a data strobe signal (dqs, dqs ) crossing to its respective clock signal (ck, ck ) crossing. the spec values are not affected by the amount of clock jitter appl ied (i.e. tjit(per), tjit(cc), etc.), as these are relative to the clock signal crossing. that is, thes e parameters should be met whether clock jitter is present or not. specific note d these parameters are measured from a data signal (dm, dq0, dq1, etc.) transition edge to its respective data strobe signal (dqs, dqs ) crossing. specific note e for these parameters, the ddr3 sdram device supports tnparam [nck] = ru{ tparam [ns] / tck(avg) [ns] }, which is in clock cycles, assuming all input cloc k jitter specifications are sati sfied. for example, the device will support tnrp = ru{trp / tck( avg)}, which is in clock cycles, if all input clock jitter specificat ions are met. this means: for ddr3-800 6-6-6, of which trp = 15ns , the device will support tnrp = ru{trp / tck(avg)} = 6, as long as the input clock jitter specifications are met, i.e. precharge com - mand at tm and active command at tm+6 is valid even if (tm+6 - tm) is less than 15ns due to input clock jitter. specific note f when the device is operated with input clock jitter, this parameter needs to be derated by the actual terr(mper),act of the inp ut clock, where 2 <= m <= 12. (output deratings are relative to the sdram input clock.) for example, if the measured jitter into a ddr3-800 sdra m has terr(mper),act,min = - 172 ps and terr(mper),act,max = + 193 ps, then tdqsck,min(derated) = tdqsck,min - terr(mper ),act,max = - 400 ps - 193 ps = - 593 ps and tdqsck,max(der- ated) = tdqsck,max - terr(mper),act,min = 400 ps + 172 ps = + 572 ps. similarly, tlz(dq) for ddr3-800 derates to tlz(dq),min(derated) = - 800 ps - 193 ps = - 993 ps and tlz(dq),max(derated) = 400 ps + 172 ps = + 572 ps. (caution on the min/max usage!) note that terr(mper),act,min is the minimum measured value of terr(nper) where 2 <= n <= 12, and terr(mper),act,max is the maximum meas ured value of terr(nper) where 2 <= n <= 12. specific note g when the device is operated with i nput clock jitter, this parameter needs to be der ated by the actual tjit(per),act of the inpu t clock. (output deratings are relative to the sdram input cloc k.) for example, if the measur ed jitter into a ddr3-800 sdram has tck(avg),act = 2500 ps, tjit(per),act,min = - 72 ps and tjit( per),act,max = + 93 ps, then trpre,min(derated) = trpre,min + tjit(per),act,min = 0.9 x tck(avg),act + tjit(per),act,min = 0.9 x 2500 ps - 72 ps = + 2178 ps. similarly, tqh,min(derated) = tqh,min + tjit(per),act,min = 0.38 x tck(av g),act + tjit(per),act,min = 0.38 x 2500 ps - 72 ps = + 878 ps. (caution on the min/ max usage!) - 36 - datasheet ddr3 sdram rev. 1.0 registered dimm 19.2 timing parameter notes 1. actual value dependant upon measurement level definitions which are tbd. 2. commands requiring a locked dll are: read (and rap) and synchronous odt commands. 3. the max values are system dependent. 4. wr as programmed in mode register 5. value must be rounded-up to next higher integer value 6. there is no maximum cycle time limit besides the need to satisfy the refresh interval, trefi. 7. for definition of rtt turn-on time taon see "device operation & timing diagram datasheet" 8. for definition of rtt turn-off time taof see "device operation & timing diagram datasheet". 9. twr is defined in ns, for calculation of twrpden it is necessary to round up twr / tck to the next integer. 10. wr in clock cycles as programmed in mr0 11. the maximum read postamble is bound by tdqsck(min) plus tqsh(min) on the left side and thz(dqs)max on the right side. see " device operation & timing diagram datasheet. 12. output timing deratings are relative to the sdram input clock. when the device is operated with input clock jitter, this pa rameter needs to be derated by tbd 13. value is only valid for ron34 14. single ended signal parameter. refer to chapter 8 and chapter 9 for definition and measurement method. 15. trefi depends on t oper 16. tis(base) and tih(base) values are for 1v/ns cmd/add single-ended slew rate and 2v/ns ck, ck differential slew rate, note for dq and dm signals, v ref (dc) = v ref dq(dc). for input only pins except reset , v ref (dc)=v ref ca(dc). see "address/command setup, hold and derating" on component datasheet. 17. tds(base) and tdh(base) values are for 1v/ns dq single-ended slew rate and 2v/ns dqs, dqs differential slew rate. note for dq and dm signals, v ref (dc)= v ref dq(dc). for input only pins except reset , v ref (dc)=v ref ca(dc). see "data setup, hold and slew rate derating" on component datasheet. 18. start of internal write transaction is defined as follows ; for bl8 (fixed by mrs and on-the-fly) : rising clock edge 4 clock cycles after wl. for bc4 (on-the-fly) : rising clock edge 4 clock cycles after wl for bc4 (fixed by mrs) : rising clock edge 2 clock cycles after wl 19. the maximum read preamble is bound by tlzdqs(min) on the left side and tdqsck(max) on the right side. see "device operation & timing diagram datasheet" 20. cke is allowed to be registered low while operations such as row activation, precharge, autoprecharge or refresh are in pro gress, but power-down idd spec will not be applied until finishing those operations. 21. although cke is allowed to be registered low after a refresh command once trefpden(min) is satisfied, there are cases where additional time such as txpdll(min) is also required. see "device operation & timing diagram datasheet". 22. defined between end of mpr read burst and mrs which reloads mpr or disables mpr function. 23. one zqcs command can effectively correct a minimum of 0.5 % (zqcorrection) of ron and rtt impedance error within 64 nck for all speed bins assuming the maximum sensitivities specified in the ?output driver voltage and temperature sensitivity? and ?odt voltage and temperature sensitivity? tables. the appropriate interval between zqcs commands can be determined from these tables and other application specific parameters. one method for calculating the interval between zqcs commands, given the temperature (tdriftrate) and voltage (vdriftrate) drift rates that the sdram is sub- ject to in the application, is illustrated. the interval could be defined by the following formula: where tsens = max(drttdt, drondtm) and vsens = max(drttdv, drondvm) define the sdram temperature and voltage sensitivities. for example, if tsens = 1.5% / c, vsens = 0.15% / mv, tdriftrate = 1 c / sec and vdriftrate = 15 mv / sec, then the interval between zqcs commands is calcu- lated as: 24. n = from 13 cycles to 50 cycles. this row defines 38 parameters. 25. tch(abs) is the absolute instantaneous clock high pulse width, as measured from one rising edge to the following falling ed ge. 26. tcl(abs) is the absolute instantaneous clock low pulse width, as measured from one falling edge to the following rising edg e. 27. the tis(base) ac150 specifications are adjusted from the tis(base) ac175 specification by adding an additional 125 ps for d dr3-800/1066 or 100ps for ddr3- 1333/1600 of derating to accommodate for the lower alternate threshold of 150mv and another 25ps to account for the earlier ref erence point [(175mv - 150 mv) / 1 v/ns]. 28. pulse width of a input signal is defined as the width between the first crossing of v ref (dc) and the consecutive crossing of v ref (dc) 29. tdqsl describes the instantaneous differential input low pulse width on dqs-dqs , as measured from one falling edge to the next consecutive rising edge. 30. tdqsh describes the instantaneous differential input high pulse width on dqs-dqs , as measured from one rising edge to the next consecutive falling edge. 31. tdqsh, act + tdqsl, act = 1 tck, act ; with txyz, act being the actual measured value of the respective timing parameter in the application. 32. tdsh, act + tdss, act = 1 tck, act ; with txyz, act being the actual measured value of the respective timing parameter in t he application. 33. the tis(base) ac125 specifications are adjusted from the tis(base) ac135 specification by adding an additional 75ps for ddr 3-1866 to accommodate for the lower alternate threshold of 125mv and another 10ps to account for the earlier reference point [(135mv - 125mv) / 1 v/ns]. zqcorrection (tsens x tdriftrate) + (vsens x vdriftrate) 0.5 (1.5 x 1) + (0.15 x 15) = 0.133 ~ ~ 128ms - 37 - datasheet ddr3 sdram rev. 1.0 registered dimm 20. physical dimensions 20.1 1gbx4 based 2gx72 module (2 ranks) - M393B2G70CB0 units : millimeters 9.50 128.95 (2x)3.00 1.27 0.10 1.0 max 17.30 1.00 0.2 0.15 2.50 0.20 detail b 5.00 detail a 1.500.10 0.80 0.05 3.80 2.50 register 9.76 18.92 32.40 18.93 9.74 10.9 c detail c 10.9 r 0 . 50 0.4 ab 2.50 2.30 133.35 0.15 30.00 0.15 max 4.0 71.00 54.675 47.00 20.1.1 x72 dimm, populated as two physical ranks of x4 ddr3 sdrams the used device is 1g x4 ddr3 sdram, fbga. ddr3 sdram part no : k4b4g0446c-bc** * note : tolerances on all dimensions 0.15 unless otherwise specified. address, command and control lines vtt vtt vtt vtt vtt vtt vtt register 2x 2.10 0.15 vtt |
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